P-scan analysis of inhomogeneously induced optical nonlinearities
JOSA B, Vol. 15, Issue 9, pp. 2446-2454 (1998)
http://dx.doi.org/10.1364/JOSAB.15.002446
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Abstract
A model for beam propagation through a nonlinear material is developed; the model takes into account inhomogeneous induced refractive-index changes due to the nonlinearity. A focused Gaussian beam of circular cross section, incident upon the sample, emerges as an elliptic Gaussian beam after interaction in this material. The nonlinearity coefficient values derived from a Z scan of photorefractive lithium niobate crystals compare favorably with that found by varying the power P of a Gaussian beam focused at a fixed longitudinal position within the sample and monitoring the far-field beam ellipticity. The nonlinearity coefficient value is used to determine the dopant's acceptor-to-donor concentration ratio in photorefractive lithium niobate samples.
© 1998 Optical Society of America
OCIS Codes
(190.0190) Nonlinear optics : Nonlinear optics
(190.5330) Nonlinear optics : Photorefractive optics
Citation
Partha P. Banerjee, Alexander Y. Danileiko, Tracy Hudson, and Deanna McMillen, "P-scan analysis of inhomogeneously induced optical nonlinearities," J. Opt. Soc. Am. B 15, 2446-2454 (1998)
http://www.opticsinfobase.org/josab/abstract.cfm?URI=josab-15-9-2446
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