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Journal of the Optical Society of America B

Journal of the Optical Society of America B


  • Vol. 16, Iss. 10 — Oct. 1, 1999
  • pp: 1672–1679

Direct measurement of 248- and 193-nm excimer-induced densification in silica–germania waveguide blanks

Nicholas F. Borrelli, Douglas C. Allan, and Robert A. Modavis  »View Author Affiliations

JOSA B, Vol. 16, Issue 10, pp. 1672-1679 (1999)

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The densification of a waveguide blank of composition 14GeO2:86SiO2 produced by 193- and 248-nm excimer exposure was measured by an interferometric technique. With the aid of a finite-element model, we derive the unconstrained densification from the experimentally determined optical phase shift. The densification versus exposure can be fitted to a power law and is compared with the behavior of fused silica. Again, with the finite-element model, an estimate is made of the refractive-index change that would be produced in a single-mode fiber. For the exposure levels typically used for the 248-nm exposure, the densification contribution to the optical index change is found to be negligible for this composition. On the other hand, for the high 193-nm exposure, the densification contribution can be dominant.

© 1999 Optical Society of America

OCIS Codes
(050.2770) Diffraction and gratings : Gratings
(060.2340) Fiber optics and optical communications : Fiber optics components
(140.3330) Lasers and laser optics : Laser damage
(140.3390) Lasers and laser optics : Laser materials processing
(160.2750) Materials : Glass and other amorphous materials
(160.5320) Materials : Photorefractive materials

Nicholas F. Borrelli, Douglas C. Allan, and Robert A. Modavis, "Direct measurement of 248- and 193-nm excimer-induced densification in silica–germania waveguide blanks," J. Opt. Soc. Am. B 16, 1672-1679 (1999)

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