OSA's Digital Library

Journal of the Optical Society of America B

Journal of the Optical Society of America B


  • Vol. 16, Iss. 4 — Apr. 1, 1999
  • pp: 600–604

Analysis of asymmetric Z-scan measurement for large optical nonlinearities in an amorphous As2S3 thin film

Chong Hoon Kwak, Yeung Lak Lee, and Seong Gyu Kim  »View Author Affiliations

JOSA B, Vol. 16, Issue 4, pp. 600-604 (1999)

View Full Text Article

Enhanced HTML    Acrobat PDF (210 KB)

Browse Journals / Lookup Meetings

Browse by Journal and Year


Lookup Conference Papers

Close Browse Journals / Lookup Meetings

Article Tools



We have extended the conventional Z-scan theory by employing an aberration-free approximation of a Gaussian beam through a nonlinear medium and derived a simple analytical formula for Z-scan transmittance, including the effects of both nonlinear absorption and nonlinear refraction, which could be applicable to the sample with large nonlinear phase shifts. We verified the extended Z-scan theory in an amorphous chalcogenide As2S3 thin film by measuring the Z-scan transmittance with both open and closed apertures. The nonlinear refractive index γ=7.6×10-5 cm2/W and the nonlinear absorption coefficient β=1.6 cm/W of As2S3 were measured at subbandgap 633-nm illumination.

© 1999 Optical Society of America

OCIS Codes
(160.2750) Materials : Glass and other amorphous materials
(160.4330) Materials : Nonlinear optical materials
(190.3270) Nonlinear optics : Kerr effect
(190.5940) Nonlinear optics : Self-action effects

Chong Hoon Kwak, Yeung Lak Lee, and Seong Gyu Kim, "Analysis of asymmetric Z-scan measurement for large optical nonlinearities in an amorphous As2S3 thin film," J. Opt. Soc. Am. B 16, 600-604 (1999)

Sort:  Author  |  Year  |  Journal  |  Reset  


  1. N. F. Mott and E. A. Davis, Electronic Processes in Non-Crystalline Materials (Clarendon, Oxford, 1979).
  2. F. Yonezawa, ed., Fundamental Physics of Amorphous Semiconductors (Springer-Verlag, Berlin, 1981).
  3. D. W. Hall, M. A. Newhouse, N. F. Borrelli, W. H. Dumbaugh, and D. L. Weidman, “Nonlinear optical susceptibilities of high-index glasses,” Appl. Phys. Lett. 54, 1293–1295 (1989). [CrossRef]
  4. C. H. Kwak, J. T. Kim, and S. S. Lee, “Scalar and vector holographic gratings recorded in a photoanisotropic amorphous As2S3 thin film,” Opt. Lett. 13, 437–439 (1988). [CrossRef] [PubMed]
  5. C. H. Kwak, S. Y. Park, H. M. Kim, E.-H. Lee, and C. M. Kim, “Dammann gratings for multispot array generation by using photoinduced anisotropic materials,” Opt. Commun. 88, 249–257 (1992). [CrossRef]
  6. C. W. Slinger, A. Zakery, P. J. S. Ewen, and A. E. Owen, “Photodoped chalcogenides as potential infrared holographic media,” Appl. Opt. 31, 2490–2498 (1992). [CrossRef] [PubMed]
  7. C. H. Kwak, J. T. Kim, and S. S. Lee, “Nonlinear optical image processing in photoanisotropic amorphous As2S3 thin film,” Appl. Opt. 28, 737–739 (1989). [CrossRef] [PubMed]
  8. M. Asobe, K. Suzuki, T. Kanamori, and K. Kubodera, “Nonlinear refractive index measurement in chalcogenide-glass fibers by self-phase modulation,” Appl. Phys. Lett. 60, 1153–1154 (1992). [CrossRef]
  9. H. Nishihara, M. Haruna, and T. Suhara, Optical Integrated Circuits (McGraw-Hill, New York, 1989).
  10. F. Michelotti, E. Fazio, F. Senesi, M. Bertolotti, V. Chumash, and A. Andriesh, “Nonlinearity and photostructural changes in glassy As2S3 thin films,” Opt. Commun. 101, 74–78 (1993). [CrossRef]
  11. R. Rangel-Rojo, T. Kosa, E. Hajto, P. J. S. Ewen, A. E. Owen, A. K. Kar, and B. S. Wherrett, “Near-infrared optical nonlinearities in amorphous chalcogenides,” Opt. Commun. 109, 145–150 (1994). [CrossRef]
  12. H. Nasu, Y. Ibara, and K. Kubodera, “Optical third-harmonic generation from some high-index glasses,” J. Non-Cryst. Solids 110, 229–234 (1989). [CrossRef]
  13. M. Sheik-Bahae, A. A. Said, T. H. Wei, D. J. Hagan, and E. W. Van Stryland, “Sensitive measurement of optical nonlinearities using a single beam,” IEEE J. Quantum Electron. 26, 760–769 (1990). [CrossRef]
  14. M. Sheik-Bahae, A. A. Said, D. J. Hagan, M. J. Solieau, and E. W. Van Stryland, “Nonlinear refraction and optical limiting in thick media,” Opt. Eng. 30, 1228–1235 (1991). [CrossRef]
  15. C. H. Kwak and S. S. Lee, “Density matrix treatment of photodarkening kinetics in amorphous chalcogenide As2S3 thin films,” Appl. Opt. 27, 2858–2862 (1988). [CrossRef] [PubMed]
  16. A. L. Dawar, P. K. Shishodia, G. Chauhan, J. C. Joshi, C. Jagadish, and P. C. Mathur, “Effect of UV exposure on optical properties of amorphous As2S3 thin films,” Appl. Opt. 29, 1971–1973 (1990). [CrossRef] [PubMed]

Cited By

Alert me when this paper is cited

OSA is able to provide readers links to articles that cite this paper by participating in CrossRef's Cited-By Linking service. CrossRef includes content from more than 3000 publishers and societies. In addition to listing OSA journal articles that cite this paper, citing articles from other participating publishers will also be listed.


Fig. 1 Fig. 2 Fig. 3

« Previous Article  |  Next Article »

OSA is a member of CrossRef.

CrossCheck Deposited