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Journal of the Optical Society of America B

Journal of the Optical Society of America B

| OPTICAL PHYSICS

  • Vol. 16, Iss. 4 — Apr. 1, 1999
  • pp: 600–604

Analysis of asymmetric Z-scan measurement for large optical nonlinearities in an amorphous As2S3 thin film

Chong Hoon Kwak, Yeung Lak Lee, and Seong Gyu Kim  »View Author Affiliations


JOSA B, Vol. 16, Issue 4, pp. 600-604 (1999)
http://dx.doi.org/10.1364/JOSAB.16.000600


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Abstract

We have extended the conventional Z-scan theory by employing an aberration-free approximation of a Gaussian beam through a nonlinear medium and derived a simple analytical formula for Z-scan transmittance, including the effects of both nonlinear absorption and nonlinear refraction, which could be applicable to the sample with large nonlinear phase shifts. We verified the extended Z-scan theory in an amorphous chalcogenide As2S3 thin film by measuring the Z-scan transmittance with both open and closed apertures. The nonlinear refractive index γ=7.6×10-5 cm2/W and the nonlinear absorption coefficient β=1.6 cm/W of As2S3 were measured at subbandgap 633-nm illumination.

© 1999 Optical Society of America

OCIS Codes
(160.2750) Materials : Glass and other amorphous materials
(160.4330) Materials : Nonlinear optical materials
(190.3270) Nonlinear optics : Kerr effect
(190.5940) Nonlinear optics : Self-action effects

Citation
Chong Hoon Kwak, Yeung Lak Lee, and Seong Gyu Kim, "Analysis of asymmetric Z-scan measurement for large optical nonlinearities in an amorphous As2S3 thin film," J. Opt. Soc. Am. B 16, 600-604 (1999)
http://www.opticsinfobase.org/josab/abstract.cfm?URI=josab-16-4-600


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