OSA's Digital Library

Journal of the Optical Society of America B

Journal of the Optical Society of America B

| OPTICAL PHYSICS

  • Vol. 17, Iss. 6 — Jun. 1, 2000
  • pp: 1077–1083

Ultrafast, dynamical imaging of surfaces by use of a scanning tunneling microscope with a photoexcited, low-temperature-grown GaAs tip

G. P. Donati, G. Rodriguez, and A. J. Taylor  »View Author Affiliations


JOSA B, Vol. 17, Issue 6, pp. 1077-1083 (2000)
http://dx.doi.org/10.1364/JOSAB.17.001077


View Full Text Article

Enhanced HTML    Acrobat PDF (774 KB)





Browse Journals / Lookup Meetings

Browse by Journal and Year


   


Lookup Conference Papers

Close Browse Journals / Lookup Meetings

Article Tools

Share
Citations

Abstract

We demonstrate ultrafast dynamical imaging of surfaces, using a scanning tunneling microscope with a low-temperature-grown GaAs tip photoexcited by 100-fs, 800-nm pulses. We use this setup to detect picosecond transients on a coplanar stripline and demonstrate a temporal resolution (full width at half-maximum) of 1.7 ps. The temporal waveform resulting from our low-temperature-grown GaAs tip is compared with waveforms obtained by means of photoconductively gated metal tips in the same setup. By dynamically imaging the stripline we demonstrate that the local conductivity in the sample is reflected in the transient correlated current and that 20-nm spatial resolution is achievable for a 2-ps transient correlated signal. Finally, we report the characterization of a picosecond pulse propagating along the stripline for millimeter-scale distances.

© 2000 Optical Society of America

OCIS Codes
(320.0320) Ultrafast optics : Ultrafast optics
(320.7100) Ultrafast optics : Ultrafast measurements
(320.7130) Ultrafast optics : Ultrafast processes in condensed matter, including semiconductors

Citation
G. P. Donati, G. Rodriguez, and A. J. Taylor, "Ultrafast, dynamical imaging of surfaces by use of a scanning tunneling microscope with a photoexcited, low-temperature-grown GaAs tip," J. Opt. Soc. Am. B 17, 1077-1083 (2000)
http://www.opticsinfobase.org/josab/abstract.cfm?URI=josab-17-6-1077


Sort:  Author  |  Year  |  Journal  |  Reset  

References

  1. S. Weiss, D. F. Ogletree, D. Botkin, M. Salmeron, and D. S. Chemla, “Ultrafast scanning probe microscopy,” Appl. Phys. Lett. 63, 2567–2569 (1993). [CrossRef]
  2. R. H. M. Groeneveld and H. van Kempen, “The capacitive origin of picosecond electrical transients detected by a photoconductively gated scanning tunneling microscope,” Appl. Phys. Lett. 69, 2294–2296 (1996). [CrossRef]
  3. U. D. Keil, J. J. Jensen, and J. M. Hvam, “Fiber-coupled ultrafast scanning tunneling microscope,” J. Appl. Phys. 81, 2929–2933 (1997). [CrossRef]
  4. D. Botkin, J. Glass, D. S. Chemla, D. F. Ogletree, M. Salmeron, and S. Weiss, “Advances in ultrafast scanning tunneling microscopy,” Appl. Phys. Lett. 69, 1321–1323 (1996). [CrossRef]
  5. S. Weiss, D. Botkin, D. F. Ogletree, M. Salmeron, and D. S. Chemla, “The ultrafast response of a scanning tunneling microscope,” Phys. Status Solidi B 188, 343–359 (1995). [CrossRef]
  6. R. H. M. Groeneveld, Th. Rasing, L. M. F. Kaufmann, E. Smalbrugge, J. H. Wolter, M. R. Melloch, and H. van Kempen, “New optoelectronic tip design for ultrafast scanning tunneling microscopy,” J. Vac. Sci. Technol. B 14, 861–863 (1996). [CrossRef]
  7. M. W. J. Prins, M. C. M. M. van der Wielen, R. Jansen, D. L. Abraham, and H. van Kempen, “Photoamperic probes in scanning tunneling microscopy,” Appl. Phys. Lett. 64, 1207–1209 (1994). [CrossRef]
  8. M. W. J. Prins, R. Jansen, R. H. M. Groeneveld, Ap. P. van Gelder, and H. van Kempen, “Photoelectrical properties of semiconductor tips in scanning tunneling microscopy,” Phys. Rev. B 53, 8090–8104 (1996). [CrossRef]
  9. G. Nunes and N. M. Amer, “Atomic resolution scanning tunneling microscopy with a gallium arsenide tip,” Appl. Phys. Lett. 63, 1851–1853 (1993). [CrossRef]
  10. R. K. Lai, J.-R. Hwang, J. Nees, T. B. Norris, and J. F. Whitaker, “A fiber-mounted, micromachined photoconductive probe with 15 nV/Hz1/2 sensitivity,” Appl. Phys. Lett. 69, 1843–1845 (1996). [CrossRef]
  11. G. P. Donati, G. Rodriguez, and A. J. Taylor, “Ultrafast scanning tunneling microscopy using a photoexcited low-temperature-grown GaAs tip,” in Ultrafast Phenomena XI (Springer-Verlag, Berlin, 1998), pp. 159–161.
  12. D. R. Grischkowsky, M. B. Ketchen, C.-C. Chi, I. I. N. Duling, N. J. Halas, J.-M. Halbout, and P. G. May, “Capacitance-free generation and detection of subpicosecond electrical pulses on coplanar transmission lines,” IEEE J. Quantum Electron. 24, 221–225 (1988). [CrossRef]
  13. S.-G. Park, A. M. Weiner, M. M. Melloch, C. W. Siders, J. L. W. Siders, and A. J. Taylor, “High-power, narrowband, terahertz generation using large-aperture photoconductors,” IEEE J. Quantum Electron. 35, 1257–1268 (1999). [CrossRef]
  14. U. D. Keil, J. R. Jensen, and J. M. Hvam, “Transient measurements with an ultrafast scanning tunneling microscope on semiconductor surfaces,” Appl. Phys. Lett. 72, 1644–1646 (1998). [CrossRef]
  15. J. A. Stroscio and W. J. Kaiser, Scanning Tunneling Microscopy (Academic, New York, 1993), Vol. 27, p. 33.
  16. G. M. Steeves, A. Y. Elezzabi, and M. R. Freeman, “Advances in picosecond scanning tunneling microscopy via junction mixing,” Appl. Phys. Lett. 70, 1909–1911 (1997). [CrossRef]
  17. G. M. Steeves, A. Y. Elezzabi, and M. R. Freeman, “Nanometer-scale imaging with an ultrafast scanning tunneling microscope,” Appl. Phys. Lett. 72, 504–506 (1998). [CrossRef]
  18. J. J. Jensen, U. D. Keil, and J. M. Hvam, “Spatio-temporal imaging of voltage pulses with an ultrafast scanning tunneling microscope,” Appl. Phys. Lett. 70, 2762–2764 (1997). [CrossRef]

Cited By

Alert me when this paper is cited

OSA is able to provide readers links to articles that cite this paper by participating in CrossRef's Cited-By Linking service. CrossRef includes content from more than 3000 publishers and societies. In addition to listing OSA journal articles that cite this paper, citing articles from other participating publishers will also be listed.


« Previous Article  |  Next Article »

OSA is a member of CrossRef.

CrossCheck Deposited