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Journal of the Optical Society of America B

Journal of the Optical Society of America B


  • Vol. 17, Iss. 6 — Jun. 1, 2000
  • pp: 910–913

Effects of polarizer and analyzer imperfections in a magneto-optical Kerr spectrometer

Chun-Yeol You and Sung-Chul Shin  »View Author Affiliations

JOSA B, Vol. 17, Issue 6, pp. 910-913 (2000)

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We have analyzed the effects of polarizer and analyzer imperfections in a phase-modulated magneto-optical Kerr spectrometer, using Jones matrices, and found that these imperfections do not seriously affect measurements of magneto-optical effects, to a first-order approximation. The analysis was experimentally proved in a magneto-optical Kerr spectrometer with a dichroic polarizer and analyzer with an extinction ratio of 10-2.

© 2000 Optical Society of America

OCIS Codes
(120.2130) Instrumentation, measurement, and metrology : Ellipsometry and polarimetry
(210.3810) Optical data storage : Magneto-optic systems
(220.4840) Optical design and fabrication : Testing
(230.3810) Optical devices : Magneto-optic systems

Chun-Yeol You and Sung-Chul Shin, "Effects of polarizer and analyzer imperfections in a magneto-optical Kerr spectrometer," J. Opt. Soc. Am. B 17, 910-913 (2000)

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  1. S. Hashimoto, Y. Ochiai, and K. Aso, “Light wavelength dependence of magneto-optical properties in ultrathin Co/Pt and Co/Pd multilayered films,” Jpn. J. Appl. Phys. 28, L1824–L1826 (1989). [CrossRef]
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  8. C.-Y. You and S.-C. Shin, “Zone-averaged method to minimize polarizer and analyzer imperfections in a phase-modulated spectroscopic ellipsometer,” Rev. Sci. Instrum. 68, 3519–3522 (1997). [CrossRef]
  9. C.-Y. You and S.-C. Shin, “A highly sensitive magneto-optical Kerr spectrometer using a sheet-type polarizer,” presented at the International Magnetism Conference, New Orleans, La., April 1–4, 1997.
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