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Journal of the Optical Society of America B

Journal of the Optical Society of America B


  • Vol. 17, Iss. 7 — Jul. 1, 2000
  • pp: 1205–1210

Polarization-interferometry measurement of the Pockels coefficient in a chiral Bi12SiO20 single crystal

S. H. Han and J. W. Wu  »View Author Affiliations

JOSA B, Vol. 17, Issue 7, pp. 1205-1210 (2000)

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Single-beam polarization interferometry was introduced to measure the Pockels coefficients in a Bi12SiO20 single crystal. The linear superposition principle of the induced birefringence and the optical activity was employed in an analysis of the Pockels effect measurement. The presence of the optical activity (the linear optical property) in a Bi12SiO20 crystal facilitated the measurement of the Pockels coefficients (the second-order nonlinear optical property) with a low modulation voltage. The longitudinal electro-optic configuration was adopted to determine one of the three Pockels tensor components. The magnitudes of r41 at the visible wavelengths were measured and found to be in the range of 3.5 to 5.0 pm/V.

© 2000 Optical Society of America

OCIS Codes
(120.3180) Instrumentation, measurement, and metrology : Interferometry
(120.5060) Instrumentation, measurement, and metrology : Phase modulation
(160.2100) Materials : Electro-optical materials
(190.0190) Nonlinear optics : Nonlinear optics
(190.4400) Nonlinear optics : Nonlinear optics, materials
(190.4720) Nonlinear optics : Optical nonlinearities of condensed matter

S. H. Han and J. W. Wu, "Polarization-interferometry measurement of the Pockels coefficient in a chiral Bi12 SiO20 single crystal," J. Opt. Soc. Am. B 17, 1205-1210 (2000)

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