The combination of atomic-force and scanning-near-field optical microscopies is useful for characterizing the physical and optical parameters of optoelectronic devices. With a commercial atomic-force microscope adapted to perform scanning-near-field optical measurements, we succeed in determining core diameters, localizing the erbium doping zone, and analyzing propagation modes in erbium-doped and multimodal optical fibers.
© 2000 Optical Society of America
C. Chicanne, S. Emonin, N. Richard, T. David, E. Bourillot, J. P. Goudonnet, and Y. Lacroute, "Characterization of optogeometric parameters of optical fibers by near-field scanning probe microscopies," J. Opt. Soc. Am. B 17, 1473-1482 (2000)