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Journal of the Optical Society of America B

Journal of the Optical Society of America B

| OPTICAL PHYSICS

  • Vol. 17, Iss. 9 — Sep. 1, 2000
  • pp: 1473–1482

Characterization of optogeometric parameters of optical fibers by near-field scanning probe microscopies

C. Chicanne, S. Emonin, N. Richard, T. David, E. Bourillot, J. P. Goudonnet, and Y. Lacroute  »View Author Affiliations


JOSA B, Vol. 17, Issue 9, pp. 1473-1482 (2000)
http://dx.doi.org/10.1364/JOSAB.17.001473


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Abstract

The combination of atomic-force and scanning-near-field optical microscopies is useful for characterizing the physical and optical parameters of optoelectronic devices. With a commercial atomic-force microscope adapted to perform scanning-near-field optical measurements, we succeed in determining core diameters, localizing the erbium doping zone, and analyzing propagation modes in erbium-doped and multimodal optical fibers.

© 2000 Optical Society of America

OCIS Codes
(060.2270) Fiber optics and optical communications : Fiber characterization
(060.2410) Fiber optics and optical communications : Fibers, erbium

Citation
C. Chicanne, S. Emonin, N. Richard, T. David, E. Bourillot, J. P. Goudonnet, and Y. Lacroute, "Characterization of optogeometric parameters of optical fibers by near-field scanning probe microscopies," J. Opt. Soc. Am. B 17, 1473-1482 (2000)
http://www.opticsinfobase.org/josab/abstract.cfm?URI=josab-17-9-1473


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