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Journal of the Optical Society of America B

Journal of the Optical Society of America B


  • Vol. 17, Iss. 9 — Sep. 1, 2000
  • pp: 1490–1497

Measurement of high-intensity laser pulse widths by use of tunneling ionization of atoms and ions

Masayuki Kakehata, Hideyuki Takada, Kenji Torizuka, Roka Ueda, and Minoru Obara  »View Author Affiliations

JOSA B, Vol. 17, Issue 9, pp. 1490-1497 (2000)

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We measured the pulse duration of amplified Ti:sapphire laser pulses by using the tunneling ionization of atoms and ions. Fringe-resolved autocorrelation signals with various effective nonlinear orders are measured by means of counting the number of ions at different charge states by the time-of-flight (TOF) method. The measured pulse widths agree well with the independently measured pulse width if we consider the pulse distortion by a focusing lens. Measurement of multiply charged ions by a TOF device is useful for extending the measurable intensity range and wavelength ranges.

© 2000 Optical Society of America

OCIS Codes
(140.7090) Lasers and laser optics : Ultrafast lasers
(190.4180) Nonlinear optics : Multiphoton processes
(190.7110) Nonlinear optics : Ultrafast nonlinear optics
(260.5210) Physical optics : Photoionization
(270.6620) Quantum optics : Strong-field processes
(320.7100) Ultrafast optics : Ultrafast measurements

Masayuki Kakehata, Hideyuki Takada, Kenji Torizuka, Roka Ueda, and Minoru Obara, "Measurement of high-intensity laser pulse widths by use of tunneling ionization of atoms and ions," J. Opt. Soc. Am. B 17, 1490-1497 (2000)

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