Entangled-photon ellipsometry
JOSA B, Vol. 19, Issue 4, pp. 656-662 (2002)
http://dx.doi.org/10.1364/JOSAB.19.000656
Acrobat PDF (205 KB)
Abstract
Performing reliable measurements in optical metrology, such as those needed in ellipsometry, requires a calibrated source and detector, or a well-characterized reference sample. We present a novel interferometric technique to perform reliable ellipsometric measurements. This technique relies on the use of a nonclassical optical source, namely, polarization-entangled twin photons generated by spontaneous parametric downconversion from a nonlinear crystal, in conjunction with a coincidence-detection scheme. Ellipsometric measurements acquired with this scheme are absolute, i.e., they require neither source nor detector calibration, nor do they require a reference.
© 2002 Optical Society of America
[Optical Society of America ]
OCIS Codes
(000.1600) General : Classical and quantum physics
(120.2130) Instrumentation, measurement, and metrology : Ellipsometry and polarimetry
(120.3940) Instrumentation, measurement, and metrology : Metrology
(190.0190) Nonlinear optics : Nonlinear optics
(270.0270) Quantum optics : Quantum optics
(350.4600) Other areas of optics : Optical engineering
Citation
Ayman F. Abouraddy, Kimani C. Toussaint, Jr., Alexander V. Sergienko, Bahaa E. A. Saleh, and Malvin C. Teich, "Entangled-photon ellipsometry," J. Opt. Soc. Am. B 19, 656-662 (2002)
http://www.opticsinfobase.org/josab/abstract.cfm?URI=josab-19-4-656
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