We compare Ti anomalous x-ray scattering factors ƒ′ obtained close to the Ti K absorption edge by two techniques: analysis of changes in Bragg peak reflectivity and resolution for scattering from a Ti/C layered synthetic microstructure (LSM) and integration through the Kramers-Kronig dispersion relationship of absorption data on pure Ti. The agreement is good for initial results and suggests that the LSM technique should be developed further as a technique for obtaining medium-accuracy x-ray optical constants across large energy ranges.
© 1985 Optical Society of America
W. K. Warburton, K. F. Ludwig, and T. W. Barbee, "Comparison between Ti anomalous x-ray scattering factors obtained from layered synthetic microstructures and the dispersion relationship," J. Opt. Soc. Am. B 2, 565-567 (1985)