We compare Ti anomalous x-ray scattering factors ƒ′ obtained close to the Ti K absorption edge by two techniques: analysis of changes in Bragg peak reflectivity and resolution for scattering from a Ti/C layered synthetic microstructure (LSM) and integration through the Kramers-Kronig dispersion relationship of absorption data on pure Ti. The agreement is good for initial results and suggests that the LSM technique should be developed further as a technique for obtaining medium-accuracy x-ray optical constants across large energy ranges.

© 1985 Optical Society of America

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