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Journal of the Optical Society of America B

Journal of the Optical Society of America B

| OPTICAL PHYSICS

  • Vol. 2, Iss. 4 — Apr. 1, 1985
  • pp: 568–569

Hyperfine structure measurements of the line 613.4 nm in bismuth using a Fourier-transform spectrometer

S. George, J. H. Munsee, and J. Verges  »View Author Affiliations


JOSA B, Vol. 2, Issue 4, pp. 568-569 (1985)
http://dx.doi.org/10.1364/JOSAB.2.000568


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Abstract

The structure of the line λ = 613.4 nm (6p3 2P° − 7s 2P) in Bi I has been completely analyzed by means of a Fourier-transform spectrometer. From the intensity calculations it is seen that only 9 components of the possible 10 can be observed. The A and B constants are also calculated and compared with earlier results. The values of the levels 7s 2P and 6p3 2P° have been recalculated to be 49 460.91 ±0.01 and 33 164.82 ±0.01 cm−1, respectively.

© 1985 Optical Society of America

Citation
S. George, J. H. Munsee, and J. Verges, "Hyperfine structure measurements of the line 613.4 nm in bismuth using a Fourier-transform spectrometer," J. Opt. Soc. Am. B 2, 568-569 (1985)
http://www.opticsinfobase.org/josab/abstract.cfm?URI=josab-2-4-568

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