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Journal of the Optical Society of America B

Journal of the Optical Society of America B


  • Vol. 2, Iss. 4 — Apr. 1, 1985
  • pp: 568–569

Hyperfine structure measurements of the line 613.4 nm in bismuth using a Fourier-transform spectrometer

S. George, J. H. Munsee, and J. Verges  »View Author Affiliations

JOSA B, Vol. 2, Issue 4, pp. 568-569 (1985)

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The structure of the line λ = 613.4 nm ( 6 p 3 2 P 3 / 2 ° 7 s 2 P 3 / 2 ) in Bi i has been completely analyzed by means of a Fourier-transform spectrometer. From the intensity calculations it is seen that only 9 components of the possible 10 can be observed. The A and B constants are also calculated and compared with earlier results. The values of the levels 7s2P3/2 and 6 p 3 2 P 3 / 2 ° have been recalculated to be 49 460.91 ±0.01 and 33 164.82 ±0.01 cm−1, respectively.

© 1985 Optical Society of America

Original Manuscript: October 9, 1984
Manuscript Accepted: December 14, 1984
Published: April 1, 1985

S. George, J. Verges, and J. H. Munsee, "Hyperfine structure measurements of the line 613.4 nm in bismuth using a Fourier-transform spectrometer," J. Opt. Soc. Am. B 2, 568-569 (1985)

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