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Journal of the Optical Society of America B

Journal of the Optical Society of America B


  • Vol. 2, Iss. 4 — Apr. 1, 1985
  • pp: 595–599

Femtosecond imaging of melting and evaporation at a photoexcited silicon surface

M. C. Downer, R. L. Fork, and C. V. Shank  »View Author Affiliations

JOSA B, Vol. 2, Issue 4, pp. 595-599 (1985)

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We describe a simple imaging technique that can be used to photograph ultrafast processes with time resolution determined by the duration of pump and probe laser pulses. We demonstrate this technique by photographs having 100-fsec time resolution of a silicon surface undergoing melting and evaporation following intense excitation by an ultrashort laser pulse. These photographs resolve the increase in surface reflectivity caused by surface melting both temporally and spatially. Material evaporation from the melted surface further alters the image of the surface by absorbing and scattering the illuminating laser light. Our analysis of this selectively imaged light suggests that the evaporated material emerges as liquid droplets several hundred angstroms in diameter, which atomize in less than a nanosecond.

© 1985 Optical Society of America

Original Manuscript: May 18, 1984
Manuscript Accepted: August 13, 1984
Published: April 1, 1985

M. C. Downer, R. L. Fork, and C. V. Shank, "Femtosecond imaging of melting and evaporation at a photoexcited silicon surface," J. Opt. Soc. Am. B 2, 595-599 (1985)

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  1. C. W. White, P. S. Peercy, eds., Laser and Electron Beam Processing of Materials (Academic, New York, 1980).
  2. J. F. Gibbons, L. D. Hess, T. W. Sigmon, eds., Laser and Electron Beam Solid Interactions and Material-Processing (North-Holland, Amsterdam, 1981).
  3. B. R. Appleton, G. K. Celler, eds., Laser and Electron Beam Interactions with Solids, (North-Holland, Amsterdam, 1982).
  4. J. Narayan, W. L. Brown, R. A. Lemons, eds., Laser-Solid Interactions and Transient Thermal Processing of Materials (North-Holland, Amsterdam, 1983).
  5. K. B. Eisenthal, R. M. Hochstrasser, W. Kaiser, A. Lauberau, eds., Picosecond Phenomena III (Springer-Verlag, Berlin, 1982). [CrossRef]
  6. D. H. Auston, C. V. Shank, “Picosecond ellipsometry of transient electron–hole plasmas in germanium,” Phys. Rev. Lett. 32, 1120 (1974). [CrossRef]
  7. C. V. Shank, R. T. Yen, C. Hirlimann, “Femtosecond time-resolved surface structural dynamics of optically excited silicon,” Phys. Rev. Lett. 51, 900 (1983). [CrossRef]
  8. For alternative interpretations, see J. A. Van Vechten, R. Tsui, F. W. Sans, “Non-thermal pulsed laser annealing of Si:plasma annealing,” Phys. Lett. 74A, 422 (1979);see also J. A. Van Vechten, “The gentle electronic nature of pulsed beam annealing, or does it really go superfluid?” in Laser and Electron Beam Interactions with Solids, B. R. Appleton, G. K. Celler, eds. (North-Holland, Amsterdam, 1982), pp. 49–60.
  9. C. V. Shank, R. Yen, C. Hirlimann, “Time-resolved reflectivity measurements of femtosecond optical-pulse-induced phase transitions in silicon,” Phys. Rev. Lett. 50, 454 (1983). [CrossRef]
  10. R. L. Fork, B. I. Greene, C. V. Shank, “Generation of optical pulses shorter than 0.1 psec by colliding pulse mode locking,” Appl. Phys. Lett. 38, 671 (1981). [CrossRef]
  11. R. L. Fork, C. V. Shank, R. Yen, “Amplification of 70-fs optical pulses to gigawatt powers,” Appl. Phys. Lett. 41, 223 (1982). [CrossRef]
  12. R. L. Fork, C. V. Shank, C. Hirlimann, R. Yen, W. J. Tomlinson, “Femtosecond white-light continuum pulses,” Opt. Lett. 8, 1 (1983). [CrossRef] [PubMed]
  13. R. Yen, J. M. Liu, H. Kurz, N. Bloembergen, “Space–time resolved reflectivity measurements of picosecond laser induced phase transitions in [111] silicon,” in Laser and Electron Beam Interactions with Solids, B. R. Appleton, G. K. Celler, eds. (North-Holland, Amsterdam, 1982), pp. 37–42.
  14. J. M. Liu, R. Yen, H. Kurz, N. Bloembergen, “Phase transformation on and charged particle emission from a silicon crystal surface, induced by picosecond laser pulses,” Appl. Phys. Lett. 39, 755 (1981). [CrossRef]
  15. M. Hanabusa, M. Suzuki, S. Nishigaki, “Dynamics of laser-induced vaporization for ultrafast deposition of amorphous silicon films,” Appl. Phys. Lett. 38, 385 (1981). [CrossRef]
  16. B. Stritzker, A. Pospieszczyk, J. A. Tagle, “Measurement of lattice temperature of silicon during pulsed laser annealing,” Phys. Rev. Lett. 47, 356 (1981). [CrossRef]
  17. H. C. van de Hulst, Light Scattering by Small Particles (Dover, New York, 1981), Chap. 4.
  18. J. M. Liu, “Thermal model of picosecond laser interactions with silicon,” Ph.D. dissertation (Harvard University, Cambridge, Mass., 1982).

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