Measurement of the Cotton–Mouton constants of noble atoms
JOSA B, Vol. 20, Issue 11, pp. 2249-2254 (2003)
http://dx.doi.org/10.1364/JOSAB.20.002249
Acrobat PDF (160 KB)
Abstract
Magnetically induced birefringence (the Cotton–Mouton effect) of argon, neon, and helium atoms was measured with a high-sensitivity ellipsometer with a 790-nm GaAlAs diode laser. The detection limit of the change in ellipticity was attained to a shot-noise-limited value of 10−10 rad. We determined the absolute values of the ellipticity changes caused by noble atoms using the light extinction ratio of the ellipsometer as an absolute standard, with this ratio measured by a method based on Malus’s law. The measured values of the Cotton–Mouton constant were (7.1±2.5)×10−10 T−2 m−1 for He atoms, (1.3±0.5)×10−9 T−2 m−1 for Ne atoms, and (1.1±0.2)×10−8 T−2 m−1 for Ar atoms at a gas pressure of 1.52×105 Pa and a gas temperature of 285–293 K.
© 2003 Optical Society of America
OCIS Codes
(120.2130) Instrumentation, measurement, and metrology : Ellipsometry and polarimetry
(160.3820) Materials : Magneto-optical materials
(260.1440) Physical optics : Birefringence
Citation
Kazuyuki Muroo, Naoki Ninomiya, Masahiro Yoshino, and Yoshitaka Takubo, "Measurement of the Cotton–Mouton constants of noble atoms," J. Opt. Soc. Am. B 20, 2249-2254 (2003)
http://www.opticsinfobase.org/josab/abstract.cfm?URI=josab-20-11-2249
You do not have subscription access to this journal. Citation lists with outbound citation links are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.
Contact your librarian or system administrator
or
Log in to access OSA Member Subscription
You do not have subscription access to this journal. Cited by links are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.
Contact your librarian or system administrator
or
Log in to access OSA Member Subscription
You do not have subscription access to this journal. Article level metrics are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.
Contact your librarian or system administrator
or
Log in to access OSA Member Subscription
Related Journal Articles 
- Simple Recurrence Matrix Relations for Multilayer Anisotropic Thin Films (AO)
- Specific approach of generalized ellipsometry for the determination of weak in-plane anisotropy: application to Langmuir–Blodgett ultrathin films (JOSAA)
- Cotton–Mouton effect of molecular oxygen: a novel measurement (JOSAB)
- Generalized Algorithm for Photoelastic Measurements Based on Phase-Stepping Imaging Polarimetry (AO)
- Anisotropic Incoherent Reflection Model for Spectroscopic Ellipsometry of a Thick Semitransparent Anisotropic Substrate (AO)
Related Conference Papers
- Spatial bright-dark solitons in transversely magnetized coupled waveguides
- High-birefringent photonic crystal fiber
- Multiwavelength fiber lasers with tunable wavelength spacing
- Real time measurement of 2-D phase retardation and optical axis of a wave plate
- Polarimetry Using Stress-Engineered Optical Elements
OSA is a member of 