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Journal of the Optical Society of America B

Journal of the Optical Society of America B

| OPTICAL PHYSICS

  • Vol. 20, Iss. 4 — Apr. 1, 2003
  • pp: 741–751

Nonlinear characterization of nanometer-thick dielectric layers by surface plasmon resonance techniques

Giancarlo Margheri, Emilia Giorgetti, Stefano Sottini, and Guido Toci  »View Author Affiliations


JOSA B, Vol. 20, Issue 4, pp. 741-751 (2003)
http://dx.doi.org/10.1364/JOSAB.20.000741


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Abstract

The use of surface plasmon resonance as a powerful tool for the nonlinear characterization of ultrathin dielectric layers is investigated and experimentally demonstrated. The off-resonant intensity-dependent refractive index of 10–200-nm-thick films of the soluble polycarbazolyldiacetylene 1,6-bis-(3,6-dihexadecyl-N-carbazolyl)-2,4-hexadiyne deposited upon silver was measured at 1064 nm and with picosecond pulses.

© 2003 Optical Society of America

OCIS Codes
(190.0190) Nonlinear optics : Nonlinear optics
(240.0240) Optics at surfaces : Optics at surfaces

Citation
Giancarlo Margheri, Emilia Giorgetti, Stefano Sottini, and Guido Toci, "Nonlinear characterization of nanometer-thick dielectric layers by surface plasmon resonance techniques," J. Opt. Soc. Am. B 20, 741-751 (2003)
http://www.opticsinfobase.org/josab/abstract.cfm?URI=josab-20-4-741

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