Highly sensitive detection of the carrier-envelope phase evolution and offset of femtosecond mode-locked oscillators
JOSA B, Vol. 21, Issue 5, pp. 1098-1103 (2004)
http://dx.doi.org/10.1364/JOSAB.21.001098
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Abstract
We demonstrate use of a lock-in detection method that is capable of highly sensitive detection of carrier-envelope-phase-sensitive phenomena. This method can measure static offsets to the carrier-envelope phase. To demonstrate the ability to measure static offsets in the phase, the change in carrier-envelope phase caused by extracavity dispersion is measured. Unavoidable offsets in measurement of the carrier-envelope phase by the standard ν-to-2ν self-referencing scheme is analyzed.
© 2004 Optical Society of America
OCIS Codes
(120.3940) Instrumentation, measurement, and metrology : Metrology
(320.7090) Ultrafast optics : Ultrafast lasers
(320.7110) Ultrafast optics : Ultrafast nonlinear optics
Citation
David J. Jones, Tara M. Fortier, and Steven T. Cundiff, "Highly sensitive detection of the carrier-envelope phase evolution and offset of femtosecond mode-locked oscillators," J. Opt. Soc. Am. B 21, 1098-1103 (2004)
http://www.opticsinfobase.org/josab/abstract.cfm?URI=josab-21-5-1098
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