We demonstrate use of a lock-in detection method that is capable of highly sensitive detection of carrier-envelope-phase-sensitive phenomena. This method can measure static offsets to the carrier-envelope phase. To demonstrate the ability to measure static offsets in the phase, the change in carrier-envelope phase caused by extracavity dispersion is measured. Unavoidable offsets in measurement of the carrier-envelope phase by the standard ν-to-2ν self-referencing scheme is analyzed.
© 2004 Optical Society of America
David J. Jones, Tara M. Fortier, and Steven T. Cundiff, "Highly sensitive detection of the carrier-envelope phase evolution and offset of femtosecond mode-locked oscillators," J. Opt. Soc. Am. B 21, 1098-1103 (2004)