Abstract
We describe a simple and robust technique for transmission confocal laser scanning microscopy wherein the detection pinhole is replaced by a thin second-harmonic generation crystal. The advantage of this technique is that self-aligned confocality is achieved without the need for signal descanning. We derive the point-spread function of our instrument and quantify both signal degradation and background rejection when imaging deep within a turbid slab. As an example, we consider a slab whose index of refraction fluctuations exhibit Gaussian statistics. Our model is corroborated by experiment.
© 2004 Optical Society of America
Full Article | PDF ArticleMore Like This
Kengyeh K. Chu, Ran Yi, and Jerome Mertz
Opt. Express 15(5) 2476-2489 (2007)
C. Yang and J. Mertz
Opt. Lett. 28(4) 224-226 (2003)
Daryl Lim, Kengyeh K. Chu, and Jerome Mertz
Opt. Lett. 33(12) 1345-1347 (2008)