We describe a simple and robust technique for transmission confocal laser scanning microscopy wherein the detection pinhole is replaced by a thin second-harmonic generation crystal. The advantage of this technique is that self-aligned confocality is achieved without the need for signal descanning. We derive the point-spread function of our instrument and quantify both signal degradation and background rejection when imaging deep within a turbid slab. As an example, we consider a slab whose index of refraction fluctuations exhibit Gaussian statistics. Our model is corroborated by experiment.
© 2004 Optical Society of America
(030.6600) Coherence and statistical optics : Statistical optics
(110.0180) Imaging systems : Microscopy
(180.1790) Microscopy : Confocal microscopy
(180.5810) Microscopy : Scanning microscopy
(190.4160) Nonlinear optics : Multiharmonic generation
Thomas Pons and Jerome Mertz, "Autoconfocal microscopy with nonlinear transmitted light detection," J. Opt. Soc. Am. B 21, 1486-1493 (2004)