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Journal of the Optical Society of America B

Journal of the Optical Society of America B


  • Editor: George I. Stegeman
  • Vol. 22, Iss. 10 — Oct. 1, 2005
  • pp: 2242–2249

Measurement of the atomic Cs [ 6 2 P 3 2 ( F e = 5 ) ] hyperfine level effective decay rate near a metallic film with diode laser retrofluorescence spectroscopy

Jean-Marie Gagné, Claude Kondo Assi, and Karine Le Bris  »View Author Affiliations

JOSA B, Vol. 22, Issue 10, pp. 2242-2249 (2005)

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Sub-Doppler signals of the hyperfine Cs [ 6 2 P 3 2 ( F e ) 6 2 S 1 2 ( F g ) ] transition lines in a diode laser-induced retro- fluorescence spectrum at the interface between glass and Cs vapor are, for the first time to our knowledge, experimentally identified and phenomenologically investigated. We propose a qualitative explanation of the origin of the sub-Doppler hyperfine line, based on kinematic effects of the population of the excited 6 2 P 3 2 ( F e ) atoms of the laser-pumped velocity classes confined in the near-field region of the interface. The role played by different relaxation processes contributing to the retrofluorescent atomic linewidth has been characterized. The effective decay rate of the atomic hyperfine level 6 2 P 3 2 ( F e = 5 ) near a metallic thin film has been measured by using both sub-Doppler retrofluorescence and frequency-modulated selective reflection spectroscopies. For a saturated Cs vapor in a glass cell at a temperature of 130°C, the effective nonradiative relaxation rate of the 6 2 P 3 2 ( F e = 5 ) energy hyperfine level due to the coupling with a metallic film is estimated to be A F e = 5 F g = 4 nf 3.10 8 s 1 .

© 2005 Optical Society of America

OCIS Codes
(240.0310) Optics at surfaces : Thin films
(260.2510) Physical optics : Fluorescence
(300.2530) Spectroscopy : Fluorescence, laser-induced
(300.6210) Spectroscopy : Spectroscopy, atomic

ToC Category:

Jean-Marie Gagné, Claude Kondo Assi, and Karine Le Bris, "Measurement of the atomic Cs[62P3/2(Fe=5)] hyperfine level effective decay rate near a metallic film with diode laser retrofluorescence spectroscopy," J. Opt. Soc. Am. B 22, 2242-2249 (2005)

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