## Theory of Gaussian beam Z scan with simultaneous third- and fifth-order nonlinear refraction based on a Gaussian decomposition method

JOSA B, Vol. 22, Issue 12, pp. 2651-2659 (2005)

http://dx.doi.org/10.1364/JOSAB.22.002651

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### Abstract

We present a detailed theoretical investigation on the Gaussian beam Z scan for arbitrary aperture and arbitrary nonlinear refraction phase shifts, based on the Gaussian decomposition method, including cases when the medium exhibits the single (2n+1)th-order nonlinear refraction effect and the simultaneous third- and fifth-order nonlinear refraction effects. We find the optimum sum upper limit, which is of great importance to fit the Z-scan traces and extract the nonlinear refraction coefficients related to the third- and fifth-order effects. This method has not only a high accuracy but is also time saving. We also discuss the influence of two-photon absorption on the Z-scan traces when materials possess the simultaneous third- and fifth-order nonlinear refraction effects associated with the two-photon absorption using the fast Fourier transform.

© 2005 Optical Society of America

**OCIS Codes**

(190.3270) Nonlinear optics : Kerr effect

(190.4420) Nonlinear optics : Nonlinear optics, transverse effects in

**ToC Category:**

Nonlinear Optics

**Citation**

Bing Gu, Jing Chen, Ya-Xian Fan, Jianping Ding, and Hui-Tian Wang, "Theory of Gaussian beam Z scan with simultaneous third- and fifth-order nonlinear refraction based on a Gaussian decomposition method," J. Opt. Soc. Am. B **22**, 2651-2659 (2005)

http://www.opticsinfobase.org/josab/abstract.cfm?URI=josab-22-12-2651

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