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Journal of the Optical Society of America B

Journal of the Optical Society of America B

| OPTICAL PHYSICS

  • Vol. 22, Iss. 2 — Feb. 1, 2005
  • pp: 437–445

Nonlinear-refractive-index measurement in As2S3 channel waveguides by asymmetric self-phase modulation

Jacques M. Laniel, Nicolas Hô, Réal Vallée, and Alain Villeneuve  »View Author Affiliations


JOSA B, Vol. 22, Issue 2, pp. 437-445 (2005)
http://dx.doi.org/10.1364/JOSAB.22.000437


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Abstract

The nonlinear refractive index (n2) of an As2S3 channel waveguide at 1.55 µm has been measured. The n2 was deduced when the spectral broadening and modulation due to self-phase modulation (SPM) were characterized. Owing to the temporal asymmetry of the injected pulse, a specific approach to asymmetric SPM is presented. The measurements have been performed for both photodarkened and nonphotodarkened etched thin films so that the effect of photodarkening on the n2 could be assessed.

© 2005 Optical Society of America

OCIS Codes
(130.3130) Integrated optics : Integrated optics materials
(190.3270) Nonlinear optics : Kerr effect
(190.4390) Nonlinear optics : Nonlinear optics, integrated optics

Citation
Jacques M. Laniel, Nicolas Hô, Réal Vallée, and Alain Villeneuve, "Nonlinear-refractive-index measurement in As2S3 channel waveguides by asymmetric self-phase modulation," J. Opt. Soc. Am. B 22, 437-445 (2005)
http://www.opticsinfobase.org/josab/abstract.cfm?URI=josab-22-2-437


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