Abstract

The Goos–Hänchen shift for a light beam totally reflected on the external interface of a dielectric thin film deposited on a high-index substrate can be strongly enhanced through some specific incidence angles corresponding to the leaky guided modes into the layer. Because the resonant eigenstates are polarization dependent, it has been possible to observe such resonance with an experimental setup based on a periodic modulation of the polarization state combined with position-sensitive detection. Classical models usually used for a single interface (Artmann’s model based on phase argument and Renard’s model based on an energetic interpretation) have been re-adapted to describe the behavior of the entire layer. Good agreement is obtained between theory and experimental results.

© 2005 Optical Society of America

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