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Journal of the Optical Society of America B

Journal of the Optical Society of America B


  • Vol. 22, Iss. 8 — Aug. 1, 2005
  • pp: 1667–1670

Localized terahertz generation via optical rectification in ZnTe

Georgi L. Dakovski, Brian Kubera, and Jie Shan  »View Author Affiliations

JOSA B, Vol. 22, Issue 8, pp. 1667-1670 (2005)

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We report the measurement of terahertz (THz) radiation, generated via optical rectification in a 20 μ m thick ZnTe crystal, as a function of the size of optical excitation. The result shows that, before the onset of significant higher-order nonlinear processes, the THz emission obtained with a fixed excitation power is largely size independent for excitation sizes smaller than the THz wavelength. This experimental finding is well described by a theoretical model including the generation of THz radiation through optical rectification from a subwavelength source and its propagation into the far field. The characteristic size dependence of the radiation from a subwavelength THz source is advantageous for use in apertureless near-field microscopy.

© 2005 Optical Society of America

OCIS Codes
(110.0180) Imaging systems : Microscopy
(190.7110) Nonlinear optics : Ultrafast nonlinear optics
(260.3090) Physical optics : Infrared, far
(320.7110) Ultrafast optics : Ultrafast nonlinear optics

Georgi L. Dakovski, Brian Kubera, and Jie Shan, "Localized terahertz generation via optical rectification in ZnTe," J. Opt. Soc. Am. B 22, 1667-1670 (2005)

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