Noise-related resolution limit of dispersion measurements with white-light interferometers
JOSA B, Vol. 22, Issue 9, pp. 1868-1874 (2005)
http://dx.doi.org/10.1364/JOSAB.22.001868
Acrobat PDF (178 KB)
Abstract
This paper presents results of our detailed theoretical and experimental analysis of the relationship between the spectral resolution and the noise in the group-delay dispersion (GDD) data measured by scanning white-light interferometry. We demonstrate that the practically achievable spectral resolution is limited, because the standard deviation of GDD is proportional to the third power of inverse spectral resolution, and for a specified accuracy the required number of averages scales with the sixth power of inverse spectral resolution. The influence of experimental parameters such as spectral brightness, bandwidth of the light source, and detection noise is examined in detail.
© 2005 Optical Society of America
OCIS Codes
(120.3180) Instrumentation, measurement, and metrology : Interferometry
(120.5050) Instrumentation, measurement, and metrology : Phase measurement
(260.2030) Physical optics : Dispersion
(320.0320) Ultrafast optics : Ultrafast optics
Citation
Anastassia Gosteva, Markus Haiml, Ruediger Paschotta, and Ursula Keller, "Noise-related resolution limit of dispersion measurements with white-light interferometers," J. Opt. Soc. Am. B 22, 1868-1874 (2005)
http://www.opticsinfobase.org/josab/abstract.cfm?URI=josab-22-9-1868
You do not have subscription access to this journal. Citation lists with outbound citation links are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.
Contact your librarian or system administrator
or
Log in to access OSA Member Subscription
You do not have subscription access to this journal. Cited by links are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.
Contact your librarian or system administrator
or
Log in to access OSA Member Subscription
You do not have subscription access to this journal. Article level metrics are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.
Contact your librarian or system administrator
or
Log in to access OSA Member Subscription
Related Journal Articles 
- Characterization of sub-6-fs optical pulses with spectral phase interferometry for direct electric-field reconstruction (OL)
- Spatially resolved amplitude and phase characterization of femtosecond optical pulses (OL)
- Direct space time-characterization of the electric fields of ultrashort optical pulses (OL)
- Single-shot kilohertz characterization of ultrashort pulses by spectral phase interferometry for direct electric-field reconstruction (OL)
- Direct Measurement of Refractive-Index Dispersion of Transparent Media by White-Light Interferometry (AO)
Related Conference Papers
- Group Refractive Index Dispersion Measurement Using Low-Coherence Tandem Interferometer
- Dispersion-Free Interferometric Autocorrelator for Measurement of Ultra-Broadband Pulses
- Novel Method of Optical Pulse Characterization Using Sinusoidal Optical Phase Modulations
- Characterization of Sub-10-fs Pulses Using Spatially Encoded Arrangement for SPIDER
- Two-Dimensional Spectral Shearing Interferometry (2DSI) for Ultrashort Pulse Characterization
« Previous Article | Next Article »
OSA is a member of 