Whispering-gallery modes in a microsphere coated with a high-refractive index layer: polarization-dependent sensitivity enhancement of the resonance-shift sensor and TE-TM resonance matching
JOSA B, Vol. 24, Issue 3, pp. 653-659 (2007)
http://dx.doi.org/10.1364/JOSAB.24.000653
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Abstract
Sensitivity enhancement of a whispering-gallery-mode microsphere resonance-shift sensor by coating of a high-refractive index (RI) layer is examined for TM polarization. The enhancement of sensitivity in response to particle adsorption or a RI change of the surroundings at the optimized layer thickness is greater for the TM mode compared with the TE mode, but the TM mode requires a thicker layer. A particular choice of the layer thickness allows the TE and TM shifts to match. Matching of the resonance frequency of the two modes is also examined.
© 2007 Optical Society of America
OCIS Codes
(170.4520) Medical optics and biotechnology : Optical confinement and manipulation
(260.2110) Physical optics : Electromagnetic optics
(300.6490) Spectroscopy : Spectroscopy, surface
ToC Category:
Physical Optics
History
Original Manuscript: September 28, 2006
Manuscript Accepted: October 27, 2006
Published: February 15, 2007
Virtual Issues
Vol. 2, Iss. 4 Virtual Journal for Biomedical Optics
Citation
Iwao Teraoka and Stephen Arnold, "Whispering-gallery modes in a microsphere coated with a high-refractive index layer: polarization-dependent sensitivity enhancement of the resonance-shift sensor and TE-TM resonance matching," J. Opt. Soc. Am. B 24, 653-659 (2007)
http://www.opticsinfobase.org/josab/abstract.cfm?URI=josab-24-3-653
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