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Journal of the Optical Society of America B

Journal of the Optical Society of America B


  • Editor: Henry M. Van Driel
  • Vol. 24, Iss. 7 — Jul. 1, 2007
  • pp: 1571–1574

Nondestructive measurement of the propagation losses in active planar waveguides

Andreas Kahn, Yury Kuzminykh, Hanno Scheife, and Günter Huber  »View Author Affiliations

JOSA B, Vol. 24, Issue 7, pp. 1571-1574 (2007)

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A nondestructive loss-measurement method for active planar waveguides has been developed. It is based on the determination of the longitudinal distribution of fluorescence light along the waveguiding direction, obtained at different excitation wavelengths. First measurements have been performed on a 10 μ m thick Nd : Sc 2 O 3 waveguiding film, deposited on a sapphire substrate by pulsed laser deposition, and on a 35 μ m thick diffusion-bonded Nd : YAG waveguide between sapphire layers. Their scattering losses have been determined to be ( 11.6 ± 0.9 ) and ( 6.9 ± 0.9 ) dB cm , respectively.

© 2007 Optical Society of America

OCIS Codes
(230.7390) Optical devices : Waveguides, planar
(310.6860) Thin films : Thin films, optical properties

ToC Category:
Optical Devices

Original Manuscript: October 31, 2006
Revised Manuscript: March 22, 2007
Manuscript Accepted: March 25, 2007
Published: June 15, 2007

Andreas Kahn, Yury Kuzminykh, Hanno Scheife, and Günter Huber, "Nondestructive measurement of the propagation losses in active planar waveguides," J. Opt. Soc. Am. B 24, 1571-1574 (2007)

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