Determination of the thermal loading in laser-diode-pumped erbium-ytterbium-codoped phosphate glass microchip laser
JOSA B, Vol. 24, Issue 9, pp. 2327-2332 (2007)
http://dx.doi.org/10.1364/JOSAB.24.002327
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Abstract
The fractional thermal loading in a laser-diode-pumped erbium-ytterbium-codoped phosphate glass microchip laser is an important parameter. We have developed two methods to determine the fractional thermal loading when the laser is operating on fundamental mode. By measuring far-field divergence angles, the thermal focal length and the fractional thermal loading of a microchip
© 2007 Optical Society of America
OCIS Codes
(000.2690) General : General physics
(140.3500) Lasers and laser optics : Lasers, erbium
(140.6810) Lasers and laser optics : Thermal effects
ToC Category:
Lasers and Laser Optics
History
Original Manuscript: December 1, 2006
Revised Manuscript: June 27, 2007
Manuscript Accepted: June 28, 2007
Published: August 22, 2007
Citation
Feng Song, Shujing Liu, Zhaohui Wu, Hong Cai, Xin Zhang, Li Teng, and Jianguo Tian, "Determination of the thermal loading in laser-diode-pumped erbium-ytterbium-codoped phosphate glass microchip laser," J. Opt. Soc. Am. B 24, 2327-2332 (2007)
http://www.opticsinfobase.org/josab/abstract.cfm?URI=josab-24-9-2327
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