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Journal of the Optical Society of America B

Journal of the Optical Society of America B

| OPTICAL PHYSICS

  • Editor: Henry M. Van Driel
  • Vol. 25, Iss. 1 — Jan. 1, 2008
  • pp: 60–66

Femtosecond laser damage threshold and nonlinear characterization in bulk transparent SiC materials

G. Logan DesAutels, Chris Brewer, Mark Walker, Shane Juhl, Marc Finet, Scott Ristich, Matt Whitaker, and Peter Powers  »View Author Affiliations


JOSA B, Vol. 25, Issue 1, pp. 60-66 (2008)
http://dx.doi.org/10.1364/JOSAB.25.000060


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Abstract

Semi-insulating and conducting SiC crystalline transparent substrates were studied after being processed by femtosecond (fs) laser radiation ( 780 nm at 160 fs ). Z-scan and damage threshold experiments were performed on both SiC bulk materials to determine each sample’s nonlinear and threshold parameters. “Damage” in this text refers to an index of refraction modification as observed visually under an optical microscope. In addition, a study was performed to understand the damage threshold as a function of numerical aperture. Presented here for the first time, to the best of our knowledge, are the damage threshold, nonlinear index of refraction, and nonlinear absorption measured values.

© 2008 Optical Society of America

OCIS Codes
(190.0190) Nonlinear optics : Nonlinear optics
(190.4180) Nonlinear optics : Multiphoton processes
(190.5970) Nonlinear optics : Semiconductor nonlinear optics including MQW

ToC Category:
Nonlinear Optics

History
Original Manuscript: September 10, 2007
Revised Manuscript: October 15, 2007
Manuscript Accepted: October 18, 2007
Published: December 21, 2007

Citation
G. Logan DesAutels, Chris Brewer, Mark Walker, Shane Juhl, Marc Finet, Scott Ristich, Matt Whitaker, and Peter Powers, "Femtosecond laser damage threshold and nonlinear characterization in bulk transparent SiC materials," J. Opt. Soc. Am. B 25, 60-66 (2008)
http://www.opticsinfobase.org/josab/abstract.cfm?URI=josab-25-1-60


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References

  1. G. Petite, P. Daguzan, S. Guizard, and P. Martin, "Femtosecond history of free carriers in the conduction band of a wide-bandgap oxide," in IEEE Annual Report Conference on Electrical Insulation and Dielectric Phenomena (IEEE, 1995), Vol. 15, pp. 40-44.
  2. A. Tien, S. Backus, H. Kapteyn, M. Murnane, and G. Mourou, "Short-pulse laser damage in transparent materials as a function of pulse duration," Phys. Rev. Lett. 82, 3883-3886 (1999). [CrossRef]
  3. J. Copper, Purdue Wide Band Gap Semiconductor Device Research Program, Purdue University College of Engineering, http://www.ecn.purdue.edu/WBG/Index.html.
  4. Y. Dong and P. Molian, "Femtosecond pulsed laser ablation of 3C-SiC thin film on silicon," Appl. Phys. A 77, 839-846 (2003). [CrossRef]
  5. J. Ashcom, C. Schaffer, and E. Mazur, "Numerical aperture dependence of damage and supercontinuum generation from femtosecond laser pulses in bulk fused silica," J. Opt. Soc. Am. B 23, 2317-2322 (2006). [CrossRef]
  6. J. Verdeyen, Laser Electronics, 3rd ed. (Prentice Hall, 1995), pp. 50-55.
  7. M. Lenzner, J. Kruger, S. Sartania, Z. Cheng, Ch. Spielmann, G. Mourou, W. Kautek, and F. Krausz, "Femtosecond optical breakdown in dielectrics," Phys. Rev. Lett. 80, 4076-4079 (1998). [CrossRef]
  8. A. M. Strelstov, J. K. Ranka, and A. L. Geata, "Femtosecond ultraviolet autocorrelation measurements based on two-photon conductivity in fused silica," Opt. Lett. 23, 798-800 (1998). [CrossRef]
  9. L. Shah, J. Tawney, M. Richardson, and K. Richardson, "Self-focusing during femtosecond micromachining of silicate glasses," IEEE J. Quantum Electron. 40, 57-68 (2004). [CrossRef]
  10. A. Evwaraye, S. Smith, and W. Mitchel, "Persistent photoconductance in in n-type 6H-SiC," J. Appl. Phys. 77, 4477-4481 (1995). [CrossRef]
  11. P. Chapple, J. Staromlynka, J. Herman, T. McKay, and R. McDuff, "Single-beam Z-scan: measurement techniques and analysis," J. Nonlinear Opt. Phys. Mater. 6, 251-293 (1997). [CrossRef]
  12. M. Sheik-Bahae, A. Said, T. Wei, D. Hagan, and E. van Stryland, "Sensitive measurement of optical nonlinearities using a single beam," IEEE J. Quantum Electron. 26, 760-769 (1990). [CrossRef]
  13. M. Yin, H. P. Li, S. H. Tang, and W. Ji, "Determination of nonlinear absorption and refraction by single Z-scan method," Appl. Phys. B 70, 587-591 (2000). [CrossRef]
  14. M. Sheik-Bahae, D. Hutchings, D. Hagan, and E. van Stryland, "Dispersion of bound electronic nonlinear refraction in solids," IEEE J. Quantum Electron. 2, 1296-1309 (1991). [CrossRef]
  15. M. Yamane and Y. Asahara, Glasses for Photonics (Cambridge U. Press, 2000), p. 174.
  16. S. Mao, F. Quére, S. Guizard, X. Mao, R. Russo, G. Petite, and P. Martin, "Dynamics of femtosecond laser interactions with dielectrics," Appl. Phys. A 79, 1695-1709 (2004). [CrossRef]

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