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Journal of the Optical Society of America B

Journal of the Optical Society of America B

| OPTICAL PHYSICS

  • Editor: Henry M. Van Driel
  • Vol. 25, Iss. 6 — Jun. 1, 2008
  • pp: A1–A12

Linear self-referencing techniques for short-optical-pulse characterization [Invited]

C. Dorrer and I. Kang  »View Author Affiliations


JOSA B, Vol. 25, Issue 6, pp. A1-A12 (2008)
http://dx.doi.org/10.1364/JOSAB.25.0000A1


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Abstract

Linear self-referencing techniques for the characterization of the electric field of short optical pulses are presented. The theoretical and practical advantages of these techniques are developed. Experimental implementations are described, and their performance is compared to the performance of their nonlinear counterparts. Linear techniques demonstrate unprecedented sensitivity and are a perfect fit in many domains where the precise, accurate measurement of the electric field of an optical pulse is required.

© 2008 Optical Society of America

OCIS Codes
(100.5070) Image processing : Phase retrieval
(120.3180) Instrumentation, measurement, and metrology : Interferometry
(170.6960) Medical optics and biotechnology : Tomography
(320.7100) Ultrafast optics : Ultrafast measurements
(320.7160) Ultrafast optics : Ultrafast technology
(130.4110) Integrated optics : Modulators

ToC Category:
Measurement of Ultrashort Electromagnetic Pulses

History
Original Manuscript: November 2, 2007
Manuscript Accepted: January 2, 2008
Published: March 28, 2008

Citation
C. Dorrer and I. Kang, "Linear self-referencing techniques for short-optical-pulse characterization [Invited]," J. Opt. Soc. Am. B 25, A1-A12 (2008)
http://www.opticsinfobase.org/josab/abstract.cfm?URI=josab-25-6-A1

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