The saturated photorefractive index determines the information storage capacity of a photorefractive crystal. Therefore, it is important to be able to measure this quantity precisely. We report a technique for measuring the saturated amplitude of the photorefractive index grating $\Delta n_0$ with a precision of 2%, by measuring the diffraction efficiency as a function of time. We also report the measurement of the half-growth time τ of the grating. The $\Delta n_0$ and τ are also verified by substitution into the theoretical formula derived from the coupled wave theory. The resulting theoretical prediction is shown to be consistent with the experimental data. The results also show that $\Delta n_0$ is almost linearly proportional to light modulation up to unit light modulation for 0.01% Fe doped $\mathrm{Li}\mathrm{Nb}{\mathrm{O}}_3$ , which may be understood from the work of Vaveliuk et al. [Phys. Rev. B 59, 10985 (1999)] work for the nonlinear regime. We will now be able to quantify the photorefractive effect of those crystals for which this method is applicable.

© 2008 Optical Society of America

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