Analytical solution of on-axis beam propagation for Z-scan technique
JOSA B, Vol. 26, Issue 11, pp. 2125-2130 (2009)
http://dx.doi.org/10.1364/JOSAB.26.002125
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Abstract
An analytical solution of on-axis beam propagation is presented for determining the nonlinear refraction and nonlinear absorption of a thin nonlinear medium accurately, efficiently, and simultaneously by a single Z-scan method. This result is based on the general Huygens–Fresnel principle. When applying our theoretical solution to the case without nonlinear absorption, it converges to the current formula based on the Huygens–Fresnel principle. For the first-order approximation, it agrees with the expression obtained by the Gaussian decomposition method. Because of the nonlinear absorption, the peaks of the Z-scan shape are suppressed, while the variation in the valleys depends on the nonlinear phase parameters.
© 2009 Optical Society of America
OCIS Codes
(140.3460) Lasers and laser optics : Lasers
(140.7010) Lasers and laser optics : Laser trapping
(190.3270) Nonlinear optics : Kerr effect
(190.4360) Nonlinear optics : Nonlinear optics, devices
(190.5940) Nonlinear optics : Self-action effects
ToC Category:
Nonlinear Optics
History
Original Manuscript: August 6, 2009
Manuscript Accepted: September 11, 2009
Published: October 20, 2009
Citation
Fang-Qin Li, Xiao-Fu Zhang, Feng Yang, Nan Zong, Qin-Jun Peng, Da-Fu Cui, and Zu-Yan Xu, "Analytical solution of on-axis beam propagation for Z-scan technique," J. Opt. Soc. Am. B 26, 2125-2130 (2009)
http://www.opticsinfobase.org/josab/abstract.cfm?URI=josab-26-11-2125
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