Abstract

We introduce a Z-scan technique as a tool to characterize small phase shift (<1 rad) and photodarkening, both effects induced inside photosensitive materials by light illumination. Theoretical analysis supported by experiments is presented for permanent refraction and absorption Gaussian profiles. Simple relations are derived in order to estimate the changes in the linear coefficients. Particularly, we investigate quantitatively the photo-induced modifications in the linear optical constants of As₂S₃ caused by subbandgap irradiation (17 ps, 1064 nm).

© 2009 Optical Society of America

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History
Original Manuscript: July 24, 2009
Manuscript Accepted: September 30, 2009
Published: October 27, 2009

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Author Affiliations

K. Fedus, G. Boudebs

Université d'Angers

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