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Journal of the Optical Society of America B

Journal of the Optical Society of America B


  • Editor: Henry Van Driel
  • Vol. 26, Iss. 7 — Jul. 1, 2009
  • pp: 1357–1362

Frequency calibration of terahertz time-domain spectrometers

M. Naftaly, R. A. Dudley, J. R. Fletcher, F. Bernard, C. Thomson, and Z. Tian  »View Author Affiliations

JOSA B, Vol. 26, Issue 7, pp. 1357-1362 (2009)

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We present three techniques of calibrating frequency and spectral profile measurements of terahertz time-domain spectrometers. The first utilizes the etalon effect generated by multiple reflections in thin nonabsorbing samples. The second employs a CO gas cell to provide multiple narrow absorption lines at known frequencies. The third aims to use a grating monochromator to produce an independently measured comparable spectrum.

© 2009 Optical Society of America

OCIS Codes
(120.3940) Instrumentation, measurement, and metrology : Metrology
(120.6200) Instrumentation, measurement, and metrology : Spectrometers and spectroscopic instrumentation
(300.6495) Spectroscopy : Spectroscopy, teraherz

ToC Category:
Instrumentation, Measurement, and Metrology

Original Manuscript: November 19, 2008
Revised Manuscript: March 5, 2009
Manuscript Accepted: May 11, 2009
Published: June 15, 2009

M. Naftaly, R. A. Dudley, J. R. Fletcher, F. Bernard, C. Thomson, and Z. Tian, "Frequency calibration of terahertz time-domain spectrometers," J. Opt. Soc. Am. B 26, 1357-1362 (2009)

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