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Journal of the Optical Society of America B

Journal of the Optical Society of America B


  • Editor: Henry van Driel
  • Vol. 27, Iss. 2 — Feb. 1, 2010
  • pp: 318–322

Field-calibrated electro-optic probe using interferometric modulations

Dong-Joon Lee, No-Weon Kang, Jae-Yong Kwon, and Tae-Weon Kang  »View Author Affiliations

JOSA B, Vol. 27, Issue 2, pp. 318-322 (2010)

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A very concise field-calibrated electro-optic probe using interference of modulated beams is presented. A model for interferometric electro-optic sensing with a sensor probe is proposed, utilizing the interference fringing slopes and field-induced electro-optic phase retardations. The sensing dynamic range is experimentally explored by investigating the modulation slopes and retardations with respect to the probe beam’s polarizations. The probe shows a dynamic range 45 dB over the microstrip lines. This sensitivity is acceptable for realizing electric field imaging of radiative electronic devices. The absolute sensitivity of the probe is also determined with a micro-TEM cell that generates accurate electric fields with calculable strength for probe calibrations.

© 2010 Optical Society of America

OCIS Codes
(230.2090) Optical devices : Electro-optical devices
(350.4010) Other areas of optics : Microwaves
(280.4788) Remote sensing and sensors : Optical sensing and sensors
(060.5625) Fiber optics and optical communications : Radio frequency photonics

ToC Category:
Optical Devices

Original Manuscript: October 19, 2009
Manuscript Accepted: December 11, 2009
Published: January 22, 2010

Dong-Joon Lee, No-Weon Kang, Jae-Yong Kwon, and Tae-Weon Kang, "Field-calibrated electro-optic probe using interferometric modulations," J. Opt. Soc. Am. B 27, 318-322 (2010)

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