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Journal of the Optical Society of America B

Journal of the Optical Society of America B

| OPTICAL PHYSICS

  • Editor: Henry van Driel
  • Vol. 27, Iss. 9 — Sep. 1, 2010
  • pp: 1874–1877

On the characteristic lengths in the variable stripe length method for optical gain measurements

L. Cerdán, A. Costela, and I. García-Moreno  »View Author Affiliations


JOSA B, Vol. 27, Issue 9, pp. 1874-1877 (2010)
http://dx.doi.org/10.1364/JOSAB.27.001874


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Abstract

Although the variable stripe length (VSL) method has been widely used to measure the optical gain in thin film active media, different nor totally rigorous criteria have yet been used to estimate two important characterization parameters, namely, threshold and saturation lengths, on which the method critically depends. Here we present a formalism which leads to analytical expressions to rigorously calculate these characteristic lengths from VSL data, providing a unique criterion for the estimation of the amplified spontaneous emission threshold and saturation points.

© 2010 Optical Society of America

OCIS Codes
(130.2790) Integrated optics : Guided waves
(140.3380) Lasers and laser optics : Laser materials
(310.6860) Thin films : Thin films, optical properties
(310.6805) Thin films : Theory and design

ToC Category:
Thin Films

History
Original Manuscript: May 3, 2010
Revised Manuscript: July 14, 2010
Manuscript Accepted: July 15, 2010
Published: August 23, 2010

Citation
L. Cerdán, A. Costela, and I. García-Moreno, "On the characteristic lengths in the variable stripe length method for optical gain measurements," J. Opt. Soc. Am. B 27, 1874-1877 (2010)
http://www.opticsinfobase.org/josab/abstract.cfm?URI=josab-27-9-1874

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