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Assessing the maximum transmittance of periodic metal-dielectric multilayers |
JOSA B, Vol. 28, Issue 10, pp. 2529-2536 (2011)
http://dx.doi.org/10.1364/JOSAB.28.002529
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Abstract
We show that the theory of potential transmittance (PT) is useful for problems involving photon tunneling through metal-dielectric stacks, regardless of whether the tunneling is mediated by Fabry–Perot or surface-plasmon resonances. A unifying principle is that, given a total thickness of metal, subdividing the metal into a larger number of thin films increases the maximum PT. For Fabry–Perot-based tunneling, we apply the concept of equivalent layers to stacks comprising dielectric-metal-dielectric unit cells and explore the conditions for impedance matching to an external air medium. This approach demonstrates that, to optimize transmittance, thicker metal films require higher-index dielectric spacers. For surface-plasmon-mediated tunneling, we confirm that the maximum transmittance also lies within the limits predicted by PT theory.
© 2011 Optical Society of America
OCIS Codes
(230.4170) Optical devices : Multilayers
(310.7005) Thin films : Transparent conductive coatings
ToC Category:
Thin Films
History
Original Manuscript: May 17, 2011
Revised Manuscript: August 23, 2011
Manuscript Accepted: August 25, 2011
Published: September 29, 2011
Citation
T. W. Allen and R. G. DeCorby, "Assessing the maximum transmittance of periodic metal-dielectric multilayers," J. Opt. Soc. Am. B 28, 2529-2536 (2011)
http://www.opticsinfobase.org/josab/abstract.cfm?URI=josab-28-10-2529
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