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Journal of the Optical Society of America B

Journal of the Optical Society of America B


  • Editor: Henry van Driel
  • Vol. 28, Iss. 11 — Nov. 1, 2011
  • pp: 2584–2591

Features of the perfect transmission in Thue–Morse dielectric multilayers

W. J. Hsueh, S. J. Wun, Z. J. Lin, and Y. H. Cheng  »View Author Affiliations

JOSA B, Vol. 28, Issue 11, pp. 2584-2591 (2011)

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We proposed a novel method to determine the perfect transmission (PT) of photonics through the Thue–Morse dielectric multilayers for arbitrary basis thickness and generation orders based on the band edge map diagram. As the order of the system increases, the density of resonance peaks increases exponentially. However, the PTs of the resonance peaks are kept even if the peaks become denser for higher-order systems. We present two iterative rules to determine the frequency of the resonance peaks for an arbitrary order of the multilayers. In addition, simple equations are proposed to approximate the repeated band edges and the PT for the arbitrary incident angle of the system with arbitrary order and basis thickness.

© 2011 Optical Society of America

OCIS Codes
(230.4170) Optical devices : Multilayers
(310.6860) Thin films : Thin films, optical properties
(160.5293) Materials : Photonic bandgap materials

ToC Category:
Optical Devices

Original Manuscript: June 28, 2011
Revised Manuscript: August 13, 2011
Manuscript Accepted: August 30, 2011
Published: October 4, 2011

W. J. Hsueh, S. J. Wun, Z. J. Lin, and Y. H. Cheng, "Features of the perfect transmission in Thue–Morse dielectric multilayers," J. Opt. Soc. Am. B 28, 2584-2591 (2011)

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