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Journal of the Optical Society of America B

Journal of the Optical Society of America B


  • Editor: Henry van Driel
  • Vol. 29, Iss. 1 — Jan. 1, 2012
  • pp: 29–34

Self-referenced spectral interferometry based on self-diffraction effect

Jun Liu, Yongliang Jiang, Takayoshi Kobayashi, Ruxin Li, and Zhizan Xu  »View Author Affiliations

JOSA B, Vol. 29, Issue 1, pp. 29-34 (2012)

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A new technique of “self-referenced spectral interferometry” is demonstrated based on a self-diffraction effect and applied to the measurement of femtosecond pulses. The reference pulse is the first-order self-diffraction pulse that is generated in a thin bulk medium by the self-diffraction process from the incident pulses. A proof-of-principle experiment succeeded in characterizing a 55 fs pulse at 800 nm and a sub- 10 fs pulse at 400 nm . The system can be simultaneously used to measure ultrashort pulses by the self-diffraction based on frequency-resolved optical gating.

© 2011 Optical Society of America

OCIS Codes
(120.3180) Instrumentation, measurement, and metrology : Interferometry
(120.5050) Instrumentation, measurement, and metrology : Phase measurement
(320.7100) Ultrafast optics : Ultrafast measurements
(320.7120) Ultrafast optics : Ultrafast phenomena

ToC Category:
Instrumentation, Measurement, and Metrology

Original Manuscript: June 29, 2011
Revised Manuscript: October 7, 2011
Manuscript Accepted: October 10, 2011
Published: December 9, 2011

Jun Liu, Yongliang Jiang, Takayoshi Kobayashi, Ruxin Li, and Zhizan Xu, "Self-referenced spectral interferometry based on self-diffraction effect," J. Opt. Soc. Am. B 29, 29-34 (2012)

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