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Journal of the Optical Society of America B

Journal of the Optical Society of America B


  • Editor: Henry van Driel
  • Vol. 29, Iss. 11 — Nov. 1, 2012
  • pp: 3063–3068

Polarization-resolved reflections in ordered and bunched silicon nanowire arrays

M. Khorasaninejad, S. Patchett, J. Sun, N. O, and S. S. Saini  »View Author Affiliations

JOSA B, Vol. 29, Issue 11, pp. 3063-3068 (2012)

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Polarization-resolved reflections from ordered and bunched silicon nanowire arrays are measured and compared. It is shown that the reflections reduce considerably in bunched nanowires for the p-polarized input while not changing considerably for the s-polarized input between the ordered and bunched nanowires. The reflection is less than 9% for the whole 230–1000 nm wavelength excitation range for the bunched nanowires in the p-polarized input. Frequency-selective reflection features are observed in the ordered nanowires. Results are explained using effective index approximation and finite difference time domain simulations.

© 2012 Optical Society of America

OCIS Codes
(050.2770) Diffraction and gratings : Gratings
(120.5700) Instrumentation, measurement, and metrology : Reflection
(160.4236) Materials : Nanomaterials
(050.6624) Diffraction and gratings : Subwavelength structures

ToC Category:

Original Manuscript: June 8, 2012
Revised Manuscript: August 27, 2012
Manuscript Accepted: September 7, 2012
Published: October 16, 2012

M. Khorasaninejad, S. Patchett, J. Sun, N. O, and S. S. Saini, "Polarization-resolved reflections in ordered and bunched silicon nanowire arrays," J. Opt. Soc. Am. B 29, 3063-3068 (2012)

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