OSA's Digital Library

Journal of the Optical Society of America B

Journal of the Optical Society of America B


  • Editor: Henry van Driel
  • Vol. 29, Iss. 3 — Mar. 1, 2012
  • pp: 363–369

Using off-specular ellipsometry spectra of dielectric grating-coupled plasmon mode for biosensing

Mohammed Nadhim Abbas, Shih-Hsin Hsu, Yia-Chung Chang, and Yu-Ju Hung  »View Author Affiliations

JOSA B, Vol. 29, Issue 3, pp. 363-369 (2012)

View Full Text Article

Enhanced HTML    Acrobat PDF (887 KB)

Browse Journals / Lookup Meetings

Browse by Journal and Year


Lookup Conference Papers

Close Browse Journals / Lookup Meetings

Article Tools



We performed spectroscopic ellipsometry measurements of the specular and off-specular reflections of a one-dimensional polymethyl methacrylate grating on a Au-coated glass substrate and analyzed the data with efficient theoretical modeling. Very good agreement is obtained between calculation and experiment for both specular and off-specular reflections. It is found that the resonance peak of the off-specular reflection is much sharper than specular reflection at a wavelength that matches the condition for exciting the interface (surface plasmon) mode. When different media are used as the ambient, we found that the off-specular reflection near the surface-plasmon resonance can give significant enhancement in detection sensitivity compared with the corresponding specular reflection. This study may open a new way for biosensing. To analyze the data, we also developed a method to compute quasi-photonic band structures for periodic structures with frequency-dependent complex dielectric constants.

© 2012 Optical Society of America

OCIS Codes
(050.0050) Diffraction and gratings : Diffraction and gratings
(120.0120) Instrumentation, measurement, and metrology : Instrumentation, measurement, and metrology
(240.6680) Optics at surfaces : Surface plasmons
(240.2130) Optics at surfaces : Ellipsometry and polarimetry

ToC Category:
Instrumentation, Measurement, and Metrology

Original Manuscript: August 10, 2011
Revised Manuscript: November 26, 2011
Manuscript Accepted: November 26, 2011
Published: February 21, 2012

Virtual Issues
Vol. 7, Iss. 5 Virtual Journal for Biomedical Optics

Mohammed Nadhim Abbas, Shih-Hsin Hsu, Yia-Chung Chang, and Yu-Ju Hung, "Using off-specular ellipsometry spectra of dielectric grating-coupled plasmon mode for biosensing," J. Opt. Soc. Am. B 29, 363-369 (2012)

Sort:  Author  |  Year  |  Journal  |  Reset  


  1. O. Solgaard, F. Ho, J. I. Thackara, and D. M. Bloom, “High frequency attenuated total internal reflection light modulator,” Appl. Phys. Lett. 61, 2500–2502 (1992). [CrossRef]
  2. N. Rotenberg, J. N. Caspers, and H. M. van Driel, “Tunable ultrafast control of plasmonic coupling to gold films,” Phys. Rev. B 80, 245420 (2009). [CrossRef]
  3. S. W. Harmer and P. D. Townsend, “Wavelength selectivity of on-axis surface plasmon laser filters,” J. Phys. D 35, 2516–2519 (2002). [CrossRef]
  4. R. Naraoka and K. Kajikawa, “Phase detection of surface plasmon resonance using rotating analyzer method,” Sens. Actuators B 107, 952–956 (2005). [CrossRef]
  5. J. J. Wang, L. Chen, S. Kwan, F. Liu, and X. Deng, “Resonant grating filters as refractive index sensors for chemical and biological detections,” J. Vac. Sci. Technol. B 23, 3006–3010 (2005). [CrossRef]
  6. B. P. Nelson, A. G. Frutos, J. M. Brockman, and R. M. Corn, “Near-infrared surface plasmon resonance measurements of ultrathin films. 1. Angle shift and SPR imaging experiments,” Anal. Chem. 71, 3928–3934 (1999). [CrossRef]
  7. H. Raether, Surface Plasmons on Smooth and Rough Surfaces and on Gratings (Springer, 1988).
  8. J. Yoon, G. Lee, S. H. Song, C.-H. Oh, and P.-S. Kim, “Surface-plasmon photonic band gaps in dielectric gratings on a flat metal surface,” J. Appl. Phys. 94, 123–129 (2003). [CrossRef]
  9. D. C. O’Shea, T. J. Suleski, A. D. Kathman, and D. W. Prather, Diffractive Optics: Design, Fabrication, and Test (SPIE, 2004).
  10. H. A. Haus, Waves and Fields in Optoelectronics (Central Book Company, 1985).
  11. B. Kaplan, T. Novikova, A. D. Martino, and B. Drévillon, “Characterization of bidimensional gratings by spectroscopic ellipsometry and angle-resolved Mueller polarimetry,” Appl. Opt. 43, 1233–1240 (2004). [CrossRef]
  12. H. Wormeester, E. S. Kooij, A. Mewe, S. Rekveld, and B. Poelsema, “Ellipsometric characterisation of heterogeneous 2D layers,” Thin Solid Films 455–456, 323–334 (2004). [CrossRef]
  13. S.-H. Hsu, Y.-C. Chang, Y.-C. Chen, P.-K. Wei, and Y. D. Kim, “Optical metrology of randomly-distributed Au colloids on a multilayer film,” Opt. Express 18, 1310–1315 (2010). [CrossRef]
  14. S.-H. Hsu, E.-S. Liu, Y.-C. Chang, J. N. Hilfiker, Y. D. Kim, T. J. Kim, C.-J. Lin, and G.-R. Lin, “Characterization of Si nanorods by spectroscopic ellipsometry with efficient theoretical modeling,” Phys. Status Solidi A 205, 876–879 (2008). [CrossRef]
  15. D. Schmidt, B. Booso, T. Hofmann, E. Schubert, A. Sarangan, and M. Schubert, “Monoclinic optical constants, birefringence, and dichroism of slanted titanium nanocolumns determined by generalized ellipsometry,” Appl. Phys. Lett. 94, 011914 (2009). [CrossRef]
  16. Y.-C. Chang, S.-H. Hsu, P.-K. Wei, and Y. D. Kim, “Optical nanometrology of Au nanoparticles on a multilayer film,” Phys. Status Solidi C 5, 1194–1197 (2008). [CrossRef]
  17. M. G. Moharam, E. B. Grann, D. A. Pommet, and T. K. Gaylord, “Formulation for stable and efficient implementation of the rigorous coupled-wave analysis of binary gratings,” J. Opt. Soc. Am. A 12, 1068–1076 (1995). [CrossRef]
  18. L. Li, “Formulation and comparison of two recursive matrix algorithms for modeling layered diffraction gratings,” J. Opt. Soc. Am. A 13, 1024–1035 (1996). [CrossRef]
  19. Y. C. Chang, G. Li, H. Chu, and J. Opsal, “Efficient finite-element, Green’s function approach for critical-dimension metrology of three-dimensional gratings on multilayer films,” J. Opt. Soc. Am. A 23, 638–645 (2006). [CrossRef]
  20. Y. C. Chang, H. Chu, and J. Opsal, “CD metrology analysis using Green’s function,” U.S. patent 6,867,866 B1 (5August2002).
  21. P. K. Tien and R. Ulrich, “Theory of prism-film coupler and thin-film light guides,” J. Opt. Soc. Am. 60, 1325–1337 (1970). [CrossRef]
  22. R. Ulrich, “Theory of the prism-film coupler by plane-wave analysis,” J. Opt. Soc. Am. 60, 1337–1350 (1970). [CrossRef]
  23. E. D. Palik, Handbook of Optical Constants of Solids(Academic, 1985).
  24. V. G. Kravets, F. Schedin, A. V. Kabashin, and A. N. Grigorenko, “Sensitivity of collective plasmon modes of gold nanoresonators to local environment,” Opt. Lett. 35, 956–958 (2010). [CrossRef]
  25. J. Homola, S. S. Yee, and G. Gauglitz, “Surface plasmon resonance sensors: review,” Sens. Actuators B 54, 3–15(1999). [CrossRef]
  26. Ju-Yi Lee, Teng-Ko Chou, and Hsueh-Ching Shih, “Polarization-interferometric surface-plasmon-resonance imaging system,” Opt. Lett. 33, 434–436 (2008). [CrossRef]
  27. A. N. Grigorenko, P. I. Nikitin, and A. V. Kabashin, “Phase jumps and interferometric surface plasmon resonance imaging,” Appl. Phys. Lett. 75, 3917–3919 (1999). [CrossRef]
  28. I. R. Hooper and J. R. Sambles, “Differential ellipsometric surface plasmon resonance sensors with liquid crystal polarization modulators,” Appl. Phys. Lett. 85, 3017–3019 (2004). [CrossRef]
  29. S.-Y. Wu and H.-P. Ho, “Single-beam self-referenced phase-sensitive surface plasmon resonance sensor with high detection resolution,” Chin. Opt. Lett. 6, 176–178 (2008). [CrossRef]

Cited By

Alert me when this paper is cited

OSA is able to provide readers links to articles that cite this paper by participating in CrossRef's Cited-By Linking service. CrossRef includes content from more than 3000 publishers and societies. In addition to listing OSA journal articles that cite this paper, citing articles from other participating publishers will also be listed.

« Previous Article  |  Next Article »

OSA is a member of CrossRef.

CrossCheck Deposited