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Journal of the Optical Society of America B

Journal of the Optical Society of America B

| OPTICAL PHYSICS

  • Editor: Henry van Driel
  • Vol. 29, Iss. 4 — Apr. 1, 2012
  • pp: 738–747

Characteristics of defect modes in side-coupled and mutually coupled microresonator arrays

Landobasa Y. M. Tobing, Liliana Tjahjana, and Dao Hua Zhang  »View Author Affiliations


JOSA B, Vol. 29, Issue 4, pp. 738-747 (2012)
http://dx.doi.org/10.1364/JOSAB.29.000738


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Abstract

We present both theoretically and experimentally the existence of defect modes in side-coupled and mutually coupled microresonator arrays. The qualitative difference between the two types of defect modes is investigated. The Q factor of both defect modes for varying defect sizes is characterized, and an enhancement of 30 × relative to individual loaded resonators is demonstrated. The defect modes are then compared with coupled resonator–induced transparency (CRIT), indicating that the defect modes based on side-coupled microresonator arrays are actually the extension of the CRIT resonance in two-resonator structures.

© 2012 Optical Society of America

OCIS Codes
(130.3120) Integrated optics : Integrated optics devices
(230.4555) Optical devices : Coupled resonators

ToC Category:
Integrated Optics

History
Original Manuscript: November 22, 2011
Revised Manuscript: January 24, 2012
Manuscript Accepted: January 24, 2012
Published: March 21, 2012

Citation
Landobasa Y. M. Tobing, Liliana Tjahjana, and Dao Hua Zhang, "Characteristics of defect modes in side-coupled and mutually coupled microresonator arrays," J. Opt. Soc. Am. B 29, 738-747 (2012)
http://www.opticsinfobase.org/josab/abstract.cfm?URI=josab-29-4-738

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