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Localization properties at band edge of local density of states in two-dimensional Thue–Morse photonic systems |
JOSA B, Vol. 29, Issue 8, pp. 2130-2137 (2012)
http://dx.doi.org/10.1364/JOSAB.29.002130
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Abstract
The spatial distribution of the local density of states (LDOS) at band edges on large-sized two-dimensional Thue–Morse dielectric systems has been investigated by means of a parallel implementation of the multipole expansion method. From the study of the LDOS participation number, the optical modes have been classified as critical, namely as intermediate between uniformly extended and exponentially localized. The exponent of power-law decay of their envelopes has been determined. Furthermore, multifractal analysis by a standard box-counting method has been performed. Almost all of the investigated modes exhibit a strong multifractal character. These results can be exploited for the designing of novel light source devices based on aperiodic order.
© 2012 Optical Society of America
OCIS Codes
(130.3120) Integrated optics : Integrated optics devices
(260.2110) Physical optics : Electromagnetic optics
(160.5298) Materials : Photonic crystals
ToC Category:
Integrated Optics
History
Original Manuscript: May 22, 2012
Revised Manuscript: June 20, 2012
Manuscript Accepted: June 20, 2012
Published: July 27, 2012
Citation
Luigi Moretti, "Localization properties at band edge of local density of states in two-dimensional Thue–Morse photonic systems," J. Opt. Soc. Am. B 29, 2130-2137 (2012)
http://www.opticsinfobase.org/josab/abstract.cfm?URI=josab-29-8-2130
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