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Journal of the Optical Society of America B

Journal of the Optical Society of America B


  • Editor: Henry van Driel
  • Vol. 29, Iss. 9 — Sep. 1, 2012
  • pp: 2373–2378

Effect of substrate orientation on terahertz optical transmission through VO2 thin films and application to functional antireflection coatings

Yanhan Zhu, Yong Zhao, Mark Holtz, Zhaoyang Fan, and Ayrton A. Bernussi  »View Author Affiliations

JOSA B, Vol. 29, Issue 9, pp. 2373-2378 (2012)

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We report studies of the terahertz (THz) transmission through vanadium dioxide (VO2) thin films grown on c-, m-, and r-plane sapphire substrates. Our results revealed THz amplitude modulation as large as 84% for VO2 films grown on r-plane sapphire substrates upon crossing the metal–insulator phase transition temperature. Complex optical conductivity and refractive indices were determined for all investigated samples in the metallic state. Results are consistent with electrical resistivity measurements and described based on the Drude model. The real and imaginary parts of the optical conductivity and refractive index are obtained, and associations with variations in the grain morphology and crystal quality are described. We show that VO2 thin films can be used as tunable broadband THz frequency antireflecting coatings.

© 2012 Optical Society of America

OCIS Codes
(310.1210) Thin films : Antireflection coatings
(310.6860) Thin films : Thin films, optical properties
(300.6495) Spectroscopy : Spectroscopy, teraherz

ToC Category:
Thin Films

Original Manuscript: March 29, 2012
Revised Manuscript: June 15, 2012
Manuscript Accepted: July 2, 2012
Published: August 9, 2012

Yanhan Zhu, Yong Zhao, Mark Holtz, Zhaoyang Fan, and Ayrton A. Bernussi, "Effect of substrate orientation on terahertz optical transmission through VO2 thin films and application to functional antireflection coatings," J. Opt. Soc. Am. B 29, 2373-2378 (2012)

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