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Journal of the Optical Society of America B

Journal of the Optical Society of America B


  • Editor: Grover Swartzlander
  • Vol. 30, Iss. 5 — May. 1, 2013
  • pp: 1167–1172

Goos–Hänchen and Imbert–Fedorov shifts at the interface of ordinary dielectric and topological insulator

Fen Liu, Jingping Xu, Ge Song, and Yaping Yang  »View Author Affiliations

JOSA B, Vol. 30, Issue 5, pp. 1167-1172 (2013)

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Using Yasumoto and Oishi’s energy flux method, we evaluated the Goos–Hänchen (GH) and Imbert–Fedorov (IF) shifts of beam incident from the ordinary dielectric upon the topological insulator (TI) with totally internal reflection. Comparing with the case of two ordinary isotropic dielectrics, it is found that the topological parameter Θ of TI can affect two shifts. More important, IF shift appears even for a linear polarized TE or TM beam and achieves the maximum with elliptical polarization, which completely originates from the TI’s intrinsic magnetoelectric coupling effect. This observation provides an optical experimental approach to determine the topological parameters Θ and provide a new way to control the GH shift and IF shift.

© 2013 Optical Society of America

OCIS Codes
(260.2110) Physical optics : Electromagnetic optics
(260.5430) Physical optics : Polarization
(160.1585) Materials : Chiral media
(160.3918) Materials : Metamaterials

ToC Category:
Physical Optics

Original Manuscript: January 7, 2013
Revised Manuscript: March 10, 2013
Manuscript Accepted: March 14, 2013
Published: April 10, 2013

Fen Liu, Jingping Xu, Ge Song, and Yaping Yang, "Goos–Hänchen and Imbert–Fedorov shifts at the interface of ordinary dielectric and topological insulator," J. Opt. Soc. Am. B 30, 1167-1172 (2013)

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