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Journal of the Optical Society of America B

Journal of the Optical Society of America B


  • Editor: Grover Swartzlander
  • Vol. 30, Iss. 6 — Jun. 1, 2013
  • pp: 1601–1605

Verification of effective refraction index approach to the surface plasmon propagation in ultrathin tapered metal–dielectric–metal slot waveguides

Alexander A. Zharov, Jr., Daria A. Smirnova, and Alexander A. Zharov  »View Author Affiliations

JOSA B, Vol. 30, Issue 6, pp. 1601-1605 (2013)

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We verify the effective refraction index approach (ERIA) developed for surface plasmon propagation in ultrathin tapered metal–dielectric–metal slot waveguides by means of comparison of exact solutions obtained within ERIA for two different profiles and different scales of tapering with finite-difference time-domain numerical simulations. We show that for smooth enough tapering, ERIA gives the plasmon field structure closely matched with numerical results. We also outline the range of the taper scales in which ERIA leads to the results different from simulations.

© 2013 Optical Society of America

OCIS Codes
(230.7400) Optical devices : Waveguides, slab
(240.6680) Optics at surfaces : Surface plasmons
(290.5825) Scattering : Scattering theory
(050.6624) Diffraction and gratings : Subwavelength structures

ToC Category:
Optics at Surfaces

Original Manuscript: March 22, 2013
Manuscript Accepted: April 22, 2013
Published: May 21, 2013

Alexander A. Zharov, Daria A. Smirnova, and Alexander A. Zharov, "Verification of effective refraction index approach to the surface plasmon propagation in ultrathin tapered metal–dielectric–metal slot waveguides," J. Opt. Soc. Am. B 30, 1601-1605 (2013)

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