The relevance of our definition for sensitivity in refractometric sensing, being the relative change in the transmittance of a certain output channel of an optical device over the change in the refractive index of the probed material, is discussed. It is compared to one based on spectral shift per refractive index unit change. Further, there is discussion on how group delay and sensitivity are interrelated and can be converted into each other and which physical quantities are relevant for high sensitivity. As a by-product of the theory presented, a general expression relating group delay and the ratio of the time-averaged optical energy and the input power is presented.
© 2014 Optical Society of America
Remote Sensing and Sensors
Original Manuscript: January 30, 2014
Revised Manuscript: April 3, 2014
Manuscript Accepted: April 30, 2014
Published: June 13, 2014
Hugo J. W. M. Hoekstra and Manfred Hammer, "General relation for group delay and the relevance of group delay for refractometric sensing," J. Opt. Soc. Am. B 31, 1561-1567 (2014)