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Journal of the Optical Society of America B

Journal of the Optical Society of America B

| OPTICAL PHYSICS

  • Vol. 7, Iss. 1 — Jan. 1, 1990
  • pp: 84–89

Two-photon spectroscopy of silicon using femtosecond pulses at above-gap frequencies

D. H. Reitze, T. R. Zhang, Wm. M. Wood, and M. C. Downer  »View Author Affiliations


JOSA B, Vol. 7, Issue 1, pp. 84-89 (1990)
http://dx.doi.org/10.1364/JOSAB.7.000084


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Abstract

Measurement of femtosecond single-pulse and time-resolved absorbance in an optically thin silicon film is used to extract the direct two-photon absorption (TPA) coefficient βTPA of silicon over a wide spectral range; it is also used to distinguish other nonlinear absorption channels, even with the fundamental pulse far above the indirect gap. We find that βTPA varies as follows: 15 cm/GW <βTPA <36 cm/GW ± 6 cm/GW over the two-photon energy range 4.0 eV < 2hv < 4.5 eV, consistent with available calculated values. The spectral structure of the results is related to the underlying band structure. The results show that second-order absorption nonlinearities dominate for fluences up to 0.07 J/cm2, just below the single-shot melting threshold. At fluences above this level a much stronger nonlinearity dominates.

© 1990 Optical Society of America

Citation
D. H. Reitze, T. R. Zhang, Wm. M. Wood, and M. C. Downer, "Two-photon spectroscopy of silicon using femtosecond pulses at above-gap frequencies," J. Opt. Soc. Am. B 7, 84-89 (1990)
http://www.opticsinfobase.org/josab/abstract.cfm?URI=josab-7-1-84


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References

  1. M. Inoue and Y. Toyozawa, J. Phys. Soc. Jpn. 20, 363 (1965).
  2. H. Mahr, "Two-photon absorption spectroscopy," in Quantum Electronics: Nonlinear Optics, H. Rabin and C. L. Tang, eds. (Academic, New York, 1975), Vol. 1, p. 287.
  3. B. S. Wherrett, J. Opt. Soc. Am. B 1, 67 (1984).
  4. J. F. Reintjes and J. C. McGroddy, Phys. Rev. Lett. 30, 901 (1973).
  5. A. Antonetti, R. Astier, J. L. Martin, A. Migus, D. Hulin, and A. Mysyrowicz, Opt. Commun. 38, 431 (1981).
  6. C. R. Pidgeon, B. S. Wherrett, A. M. Johnston, J. Dempsey, and A. Miller, Phys. Rev. Lett. 42, 1785 (1979).
  7. A. L. Smirl, T. F. Boggess, I. W. Boyd, S. C. Moss, K. Bohnert, and K. Mansour, Opt. Eng. 25, 157 (1986); T. F. Boggess, A. L. Smirl, S. C. Moss, I. W. Boyd, and E. W. van Stryland, IEEE J. Quantum Electron. 21, 488 (1985).
  8. W. H. Knox, J. B. Stark, D. S. Chemla, D. A. B. Miller, and S. Schmitt-Rink, in Ultrafast Phenomena VI, T. Yajima, K. Yoshihara, C. B. Harris, and S. Shionoya, eds. (Springer-Verlag, Berlin, 1988), p. 331.
  9. S. S. Jha and N. Bloembergen, Phys. Rev. 171, 891 (1968); J. C. Phillips and J. A. van Vechten, Phys. Rev. 183, 709 (1969); C. Flytzanis, Phys. Lett. 31A, 273 (1969).
  10. D. J. Moss, H. M. van Driel, and J. E. Sipe, Opt. Lett. 14, 57 (1989); D. J. Moss, J. E. Sipe, and H. M. van Driel, "Band structure calculation of dispersion and anisotropy in X(3) for third harmonic generation in Si, Ge, and GaAs," Phys. Rev. B (to be published).
  11. Extensions of these calculations to two-photon absorption are in progress (H. M. van Driel, Department of Physics, University of Toronto, Toronto, Ontario, Canada, personal communication).
  12. C. V. Shank, R. Yen, and C. Hirlimann, Phys. Rev. Lett. 50, 454 (1983).
  13. M. C. Downer, R. L. Fork, and C. V. Shank, J. Opt. Soc. Am. B 2, 595 (1985).
  14. C. V. Shank, R. Yen, and C. Hirlimann, Phys. Rev. Lett. 51, 900 (1983).
  15. H. W. K. Tom, G. D. Aumiller, and C. H. Brito-Cruz, Phys. Rev. Lett. 60, 1438 (1988).
  16. P. Hermes, B. Danielzik, N. Fabricius, D. von der Linde, J. Kuhl, J. Heppner, B. Stritzker, and A. Pospieszczyk, Appl. Phys. A 39, 9 (1986).
  17. M. Combescot and J. Bok, Phys. Rev. Lett. 48, 1413 (1982); J. A. van Vechten, R. Tsu, F. W. Saris, and D. Hoonhout, Phys. Lett. 74A, 417, 422 (1979); R. Biswas and V. Ambegaokar, Phys. Rev. B 26, 1980 (1982).
  18. H. Kurz and N. Bloembergen, in Energy Beam-Solid Interactions and Transient Thermal Processing, D. K. Biegelson, G. A. Rozgonyi, and C. V. Shank, eds. (Materials Research Society, Pittsburgh, Pa., 1985), p. 3, and references therein.
  19. Wm. M. Wood, G. Focht, and M. C. Downer, Opt. Lett. 13, 984 (1988).
  20. O. S. Heavens, Optical Properties of Thin Solid Films (Dover, New York, 1985).
  21. F. E. Doany and D. Grischkowsky, Appl. Phys. Lett. 52, 36 (1988).
  22. W. Kutt, K. Seibert, and H. Kurz, in Ultrafast Phenomena VI, T. Yajima, K. Yoshihara, C. B. Harris, and S. Shionoya, eds. (Springer-Verlag, Berlin, 1988), p. 233.
  23. R. L. Fork, C. V. Shank, C. Hirlimann, R. Yen, and W. J. Tomlinson, Opt. Lett. 8, 1 (1983).
  24. E. P. Ippen and C. V. Shank, in Ultrashort Light Pulses, S. L. Shapiro, ed. (Springer-Verlag, Berlin, 1984), p. 83.
  25. W. Kutt, K. Seibert, A. Esser, U. Lemmer, A. M. Malvezzi, and H. Kurz, "Generation, cooling, and recombination of a dense electron–hole plasma in silicon," submitted to Appl. Phys. Lett.
  26. M. C. Downer and C. V. Shank, Phys. Rev. Lett. 56, 761 (1986).
  27. K. F. Berggren and B. E. Sernelius, Phys. Rev. B 24, 1971 (1981).
  28. J. M. Moison, F. Barthe, and M. Bensoussan, Phys. Rev. B 27, 3611 (1983).
  29. C. Haas, Phys. Rev. 125, 1965 (1962); S. M. Ryvkin, Phys. Status Solidi 11, 285 (1965).
  30. See, for example, J. C. Phillips, Bands and Bonds in Semiconductors (Academic, New York, 1973).
  31. T. R. Bader and A. Gold, Phys. Rev. 171, 997 (1968).
  32. A. Haug, Solid-State Electron. 21, 1281 (1978).
  33. M. Rasolt, A. M. Malvezzi, and H. Kurz, Appl. Phys. Lett. 51, 2208 (1987).

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