Absolute photoluminescent efficiency and photon damage of sodium salicylate in the soft-x-ray regime
JOSA B, Vol. 9, Issue 1, pp. 152-156 (1992)
http://dx.doi.org/10.1364/JOSAB.9.000152
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Abstract
We have measured the absolute photoluminescent efficiency of sodium salicylate from 70 to 400 eV, as well as the inelastic electron-scattering spectrum from 0 to 200 eV. We find that features in the luminescence spectrum can be described well by using a model incorporating absorptance, reflectance, carrier-diffusion length, and reduced surface-recombination velocity. We have also measured the dose (total photons/unit area) dependence of the model's efficiency at several photon energies. Results indicate a decrease in efficiency when dose and x-ray energy are increased, which makes this material a nonideal choice for long-term stable detection of high-intensity soft x rays. The decrease in efficiency is caused by a bulk-damage process that is second order in the number of electron—hole pairs produced by recombination velocity.
© 1992 Optical Society of America
Citation
D. E. Husk, C. Tarrio, E. L. Benitez, and S. E. Schnatterly, "Absolute photoluminescent efficiency and photon damage of sodium salicylate in the soft-x-ray regime," J. Opt. Soc. Am. B 9, 152-156 (1992)
http://www.opticsinfobase.org/josab/abstract.cfm?URI=josab-9-1-152
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