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Journal of the Optical Society of America B

Journal of the Optical Society of America B


  • Vol. 9, Iss. 8 — Aug. 1, 1992
  • pp: 1428–1431

Temperature dependence of the electron mobility in photorefractive Bi12SiO20

P. Nouchi, J. P. Partanen, and R. W. Hellwarth  »View Author Affiliations

JOSA B, Vol. 9, Issue 8, pp. 1428-1431 (1992)

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We have measured the temperature dependence of the electron mobility in a single crystal of photorefractive n-type cubic Bi12SiO20 by using a holographic time-of-flight technique. Our results show that the mobility, with a value μ = 0.24 ± 0.07 cm2/(V s) at room temperature, has a temperature dependence of the Arrhenius form, with an activation energy of 320 ± 40 meV in the experimental range 270–310 K.

© 1992 Optical Society of America

Original Manuscript: November 20, 1991
Revised Manuscript: February 11, 1992
Published: August 1, 1992

P. Nouchi, J. P. Partanen, and R. W. Hellwarth, "Temperature dependence of the electron mobility in photorefractive Bi12SiO20," J. Opt. Soc. Am. B 9, 1428-1431 (1992)

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