We have measured the temperature dependence of the electron mobility in a single crystal of photorefractive n-type cubic Bi12SiO20 by using a holographic time-of-flight technique. Our results show that the mobility, with a value μ = 0.24 ± 0.07 cm2/(V s) at room temperature, has a temperature dependence of the Arrhenius form, with an activation energy of 320 ± 40 meV in the experimental range 270–310 K.
© 1992 Optical Society of America
Original Manuscript: November 20, 1991
Revised Manuscript: February 11, 1992
Published: August 1, 1992
P. Nouchi, J. P. Partanen, and R. W. Hellwarth, "Temperature dependence of the electron mobility in photorefractive Bi12SiO20," J. Opt. Soc. Am. B 9, 1428-1431 (1992)