Explicit asymptotic formulas are derived for the positions, widths, and strengths of the morphology-dependent resonances in Mie scattering. These formulas are compared with numerical data and found to be highly accurate, especially for the low-order resonances most relevant to nonlinear processes. They permit the interpretation of experimental data on light scattering from microdroplets without resorting to the full apparatus of the Mie scattering formalism.
© 1992 Optical Society of America
Original Manuscript: October 16, 1991
Revised Manuscript: February 27, 1992
Published: September 1, 1992
C. C. Lam, P. T. Leung, and K. Young, "Explicit asymptotic formulas for the positions, widths, and strengths of resonances in Mie scattering," J. Opt. Soc. Am. B 9, 1585-1592 (1992)