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Journal of the Optical Society of America B

Journal of the Optical Society of America B

| OPTICAL PHYSICS

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Instrumentation, measurement, and metrology : Nondestructive testing


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  • JOSA A, Vol. 31, Issue 9, pp. 1919-1922 (September 2014)
  • Rishikesh Kulkarni, Pramod Rastogi

  • JOSA A, Vol. 31, Issue 10, pp. 2285-2293 (October 2014)
  • Wanli Tu, Shuncong Zhong, Yaochun Shen, Qing Zhou, Ligang Yao

  • Optics Letters, Vol. 39, Issue 13, pp. 3722-3724 (July 2014)
  • Rishikesh Kulkarni, Pramod Rastogi

  • Optics Letters, Vol. 39, Issue 13, pp. 3853-3856 (July 2014)
  • J. L. M. van Mechelen, A. B. Kuzmenko, H. Merbold

  • Optics Letters, Vol. 39, Issue 15, pp. 4462-4465 (August 2014)
  • Tongqing Liu, Lingling Hu, Ming Han

  • Optics Letters, Vol. 39, Issue 20, pp. 5795-5797 (October 2014)
  • Philipp Huke, Martin Schröder, Sandra Hellmers, Michael Kalms, Ralf B. Bergmann

  • Optics Express, Vol. 22, Issue 11, pp. 13515-13530 (June 2014)
  • Alex Mrozack, Martin Heimbeck, Daniel L. Marks, Jonathan Richard, Henry O. Everitt, David J. Brady

  • Optics Express, Vol. 22, Issue 13, pp. 15804-15819 (June 2014)
  • Rong Su, Mikhail Kirillin, Ernest W. Chang, Ekaterina Sergeeva, Seok H. Yun, Lars Mattsson

  • Optics Express, Vol. 22, Issue 17, pp. 20595-20606 (August 2014)
  • Tetsuo Iwata, Hiroaki Uemura, Yasuhiro Mizutani, Takeshi Yasui

  • Optics Express, Vol. 22, Issue 18, pp. 21145-21156 (September 2014)
  • Yangjin Kim, Kenichi Hibino, Ryohei Hanayama, Naohiko Sugita, Mamoru Mitsuishi

  • Optics Express, Vol. 22, Issue 19, pp. 23192-23201 (September 2014)
  • Rishikesh Kulkarni, Pramod Rastogi

  • Optics Express, Vol. 22, Issue 21, pp. 25517-25529 (October 2014)
  • Marc P. Georges, Jean-François Vandenrijt, Cédric Thizy, Igor Alexeenko, Giancarlo Pedrini, Birgit Vollheim, Ion Lopez, Iagoba Jorge, Jonathan Rochet, Wolfgang Osten

  • Optics Express, Vol. 22, Issue 22, pp. 27542-27552 (November 2014)
  • Ingeun Lee, Dong-Joon Lee, EunMi Choi

  • Optics Express, Vol. 22, Issue 24, pp. 29554-29567 (December 2014)
  • C. Brun, X. Buet, B. Bresson, M. S. Capelle, M. Ciccotti, A. Ghomari, P. Lecomte, J. P. Roger, M. N. Petrovich, F. Poletti, D. J. Richardson, D. Vandembroucq, G. Tessier

  • Applied Optics, Vol. 53, Issue 22, pp. 5070-5077 (August 2014)
  • Ping Liu, Roger M. Groves, Rinze Benedictus

  • Applied Optics, Vol. 53, Issue 24, pp. 5290-5293 (August 2014)
  • Hiroyuki Ichikawa, Tomohiro Toda

  • Applied Optics, Vol. 53, Issue 24, pp. 5439-5447 (August 2014)
  • Firas Sawaf, Roger M. Groves

  • Applied Optics, Vol. 53, Issue 26, pp. 5906-5911 (September 2014)
  • Ke Zhang, Li Tao, Wenkai Cheng, Jianhua Liu, Zhongping Chen

  • Applied Optics, Vol. 53, Issue 31, pp. 7483-7486 (November 2014)
  • Ke Zhang, Li Tao, Wenkai Cheng, Jianhua Liu, Zhongping Chen

  • Chinese Optics Letters, Vol. 12, Issue 8, pp. 081201- (August 2014)
  • Zhilong Li, Zhijun Wu, Ya Gao, Huifeng Gong, Weidi Huang, Minjing Zhu, Liguang Li
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