Standard optical coaxial double fiber diameter and refractive index measurement, accuracy, and precision using light scattering at normal incidence

• Abstract

• JOSA A, Vol. 27, Issue 1, pp. 1-5 (January 2010)
• Fumiaki Tajima, Yoshio Nishiyama, Noriyoshi Hiroi, Yoshihide Hashimoto

Terahertz reflection spectroscopy of Debye relaxation in polar liquids [Invited]

• Abstract

• JOSA B, Vol. 26, Issue 9, pp. A113-A125 (September 2009)
• Uffe Møller, David G. Cooke, Koichiro Tanaka, Peter Uhd Jepsen

Determination of photo-induced changes in linear optical coefficients by the Z-scan technique

• Abstract

• JOSA B, Vol. 26, Issue 11, pp. 2171-2175 (November 2009)
• K. Fedus, G. Boudebs

Parametric investigation and analysis of fishnet metamaterials in the microwave regime

• Abstract

• JOSA B, Vol. 26, Issue 12, pp. B61-B67 (December 2009)
• N.-H. Shen, G. Kenanakis, M. Kafesaki, N. Katsarakis, E. N. Economou, C. M. Soukoulis

Generalized ellipsometry for monoclinic absorbing materials: determination of optical constants of Cr columnar thin films

• Abstract

• Optics Letters, Vol. 34, Issue 7, pp. 992-994 (April 2009)
• D. Schmidt, B. Booso, T. Hofmann, E. Schubert, A. Sarangan, M. Schubert

Polarization-ratio reflectance measurements in the extreme ultraviolet

• Abstract

• Optics Letters, Vol. 34, Issue 9, pp. 1429-1431 (May 2009)
• N. Brimhall, N. Heilmann, M. Ware, J. Peatross

Beam refraction and displacement in a differential refractometer with an absorbing sample

• Abstract

• Optics Letters, Vol. 34, Issue 14, pp. 2192-2194 (July 2009)
• Augusto García-Valenzuela

Measuring near-field nanoparticle concentration profiles by correlating surface plasmon resonance reflectance with effective refractive index of nanofluids

• Abstract

• Optics Letters, Vol. 35, Issue 3, pp. 393-395 (February 2010)
• Iltai Kim, Kenneth D. Kihm

Using modified Kramers–Kronig relations to test transmission spectra of porous media in THz-TDS

• Abstract

• Optics Letters, Vol. 35, Issue 5, pp. 631-633 (March 2010)
• H. Tuononen, E. Gornov, J. A. Zeitler, J. Aaltonen, K.-E. Peiponen

Separation of high order harmonics with fluoride windows

• Abstract
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• Optics Express, Vol. 17, Issue 11, pp. 8941-8946 (May 2009)
• T. K. Allison, J. van Tilborg, T. W. Wright, M. P. Hertlein, R. W. Falcone, A. Belkacem

Detection and characterization of carbon contamination on EUV multilayer mirrors

• Abstract
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• Optics Express, Vol. 17, Issue 19, pp. 16969-16979 (September 2009)
• Juequan Chen, Eric Louis, Chris J. Lee, Herbert Wormeester, Reinhard Kunze, Hagen Schmidt, Dieter Schneider, Roel Moors, Willem van Schaik, Monika Lubomska, Fred Bijkerk

Determination of effective complex refractive index of a turbid liquid with surface plasmon resonance phase detection

• Abstract

• Applied Optics, Vol. 48, Issue 7, pp. 1262-1267 (March 2009)
• Zhang Yingying, Lai Jiancheng, Yin Cheng, Li Zhenhua

Piezo-optic coefficients of MgO-doped LiNbO₃ crystals

• Abstract

• Applied Optics, Vol. 48, Issue 10, pp. 1904-1911 (April 2009)
• Bogdan G. Mytsyk, Anatoliy S. Andrushchak, Nataliya M. Demyanyshyn, Yaroslav P. Kost', Andriy V. Kityk, Pietro Mandracci, Wilfried Schranz

High-accuracy interferometer with a prism pair for measurement of the absolute refractive index of glass

• Abstract

• Applied Optics, Vol. 48, Issue 11, pp. 2045-2050 (April 2009)
• Yasuaki Hori, Akiko Hirai, Kaoru Minoshima, Hirokazu Matsumoto

Measurement method for the refractive index of thick solid and liquid layers

• Abstract

• Applied Optics, Vol. 48, Issue 22, pp. 4430-4436 (August 2009)
• Branko Šantić, Davor Gracin, Krunoslav Juraić

Simultaneous measurement of refractive index and wedge angle of optical windows using Fizeau interferometry and a cyclic path optical configuration

• Abstract

• Applied Optics, Vol. 48, Issue 24, pp. 4756-4761 (August 2009)
• Y. Pavan Kumar, Sanjib Chatterjee

Optical diagnostics of anisotropic nanoscale films on transparent isotropic materials by integrating reflectivity and ellipsometry

• Abstract

• Applied Optics, Vol. 48, Issue 31, pp. 5906-5916 (November 2009)
• Peep Adamson

Optical properties of boron carbide near the boron K edge evaluated by soft-x-ray reflectometry from a Ru/B₄C multilayer

• Abstract

• Applied Optics, Vol. 48, Issue 35, pp. 6684-6691 (December 2009)
• Dmitriy Ksenzov, Tobias Panzner, Christoph Schlemper, Christian Morawe, Ullrich Pietsch

Measurement and numerical studies of optical properties of YAG:Ce phosphor for white light-emitting diode packaging

• Abstract

• Applied Optics, Vol. 49, Issue 2, pp. 247-257 (January 2010)
• Zongyuan Liu, Sheng Liu, Kai Wang, Xiaobing Luo

Simultaneous measurement of thermo-optic and stress-optic coefficients of polymer thin films using prism coupler technique

• Abstract

• Applied Optics, Vol. 49, Issue 3, pp. 403-408 (January 2010)
• Md. Faruque Hossain, Hau Ping Chan, Mohammad Afsar Uddin