Self-consistent optical constants of SiC thin films

• Abstract

• JOSA A, Vol. 28, Issue 11, pp. 2340-2345 (November 2011)
• Juan I. Larruquert, Antonio P. Pérez-Marín, Sergio García-Cortés, Luis Rodríguez-de Marcos, José A. Aznárez, José A. Méndez

Self-consistent optical constants of sputter-deposited B₄C thin films

• Abstract

• JOSA A, Vol. 29, Issue 1, pp. 117-123 (January 2012)
• Juan I. Larruquert, Antonio P. Pérez-Marín, Sergio García-Cortés, Luis Rodríguez-de Marcos, José A. Aznárez, José A. Méndez

Measurement of the infrared complex Faraday angle in semiconductors and insulators

• Abstract

• JOSA B, Vol. 28, Issue 2, pp. 199-207 (February 2011)
• M.-H. Kim, V. Kurz, G. Acbas, C. T. Ellis, J. Cerne

Kramers–Kronig analysis on the real refractive index of porous media in the terahertz spectral range

• Abstract

• Optics Letters, Vol. 36, Issue 5, pp. 778-780 (March 2011)
• Pertti Silfsten, Ville Kontturi, Tuomas Ervasti, Jarkko Ketolainen, Kai-Erik Peiponen

Refractive index measurements of solid parahydrogen

• Abstract

• Optics Letters, Vol. 36, Issue 6, pp. 840-842 (March 2011)
• Manori Perera, Brian A. Tom, Yuki Miyamoto, Michael W. Porambo, Lauren E. Moore, William R. Evans, Takamasa Momose, Benjamin J. McCall

Effect of varying pore size of AAO films on refractive index and birefringence measured by prism coupling technique

• Abstract

• Optics Letters, Vol. 36, Issue 21, pp. 4272-4274 (November 2011)
• Su-Hyun Gong, Arnaud Stolz, Gi-Hwan Myeong, Elhadj Dogheche, Anisha Gokarna, Sang-Wan Ryu, Didier Decoster, Yong-Hoon Cho

Assessment of wavelength dependent complex refractive index of strongly light absorbing liquids

• Abstract
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• Optics Express, Vol. 20, Issue 3, pp. 2835-2843 (January 2012)
• Jukka Räty, Pertti Pääkkönen, Kai-Erik Peiponen

Optical properties of indium phosphide in the 50–200Å wavelength region using a reflectivity technique

• Abstract

• Applied Optics, Vol. 49, Issue 28, pp. 5378-5383 (October 2010)
• P. N. Rao, Mohammed H. Modi, G. S. Lodha

Extrinsic fiber-optic Fabry–Perot interferometer sensor for refractive index measurement of optical glass

• Abstract

• Applied Optics, Vol. 49, Issue 29, pp. 5592-5596 (October 2010)
• Ji-Huan Chen, Jia-Rong Zhao, Xu-Guang Huang, Zhen-Jian Huang

Prism-pair interferometry by homodyne interferometers with a common light source for high-accuracy measurement of the absolute refractive index of glasses

• Abstract

• Applied Optics, Vol. 50, Issue 8, pp. 1190-1196 (March 2011)
• Yasuaki Hori, Akiko Hirai, Kaoru Minoshima

Transmittance and optical constants of erbium films in the 3.25−1580 eV spectral range

• Abstract

• Applied Optics, Vol. 50, Issue 15, pp. 2211-2219 (May 2011)
• Juan I. Larruquert, Fabio Frassetto, Sergio García-Cortés, Manuela Vidal-Dasilva, Mónica Fernández-Perea, José A. Aznárez, José A. Méndez, Luca Poletto, A. Marco Malvezzi, Angelo Giglia, Stefano Nannarone

Inverse relationships for reflection diagnostics of uniaxially anisotropic nanoscale films on isotropic materials

• Abstract

• Applied Optics, Vol. 50, Issue 17, pp. 2773-2783 (June 2011)
• Peep Adamson

Interferometric investigation and simulation of refractive index in glass matrixes containing nanoparticles of varying sizes

• Abstract

• Applied Optics, Vol. 50, Issue 19, pp. 3259-3267 (July 2011)
• Michael Gerard Feeney, Rabia Ince, Mehmet Hikmet Yukselici, Cagdas Allahverdi

Refractive index measured by laser beam displacement at λ=1064 nm for solvents and deuterated solvents

• Abstract

• Applied Optics, Vol. 50, Issue 21, pp. 4091-4098 (July 2011)
• David P. Shelton

Measuring the optical properties of astrophysical dust analogues: instrumentation and methods

• Abstract

• Applied Optics, Vol. 50, Issue 21, pp. 4115-4123 (July 2011)
• Stephen A. Rinehart, Dominic J. Benford, Giuseppe Cataldo, Eliahu Dwek, Ross Henry, Raymond E. Kinzer, Jr., Joseph Nuth, Robert Silverberg, Caleb Wheeler, Edward Wollack

Characterization of the optical properties of an infrared blocked impurity band detector

• Abstract

• Applied Optics, Vol. 50, Issue 24, pp. 4824-4833 (August 2011)
• S. I. Woods, S. G. Kaplan, T. M. Jung, A. C. Carter

Calibration method using a single retarder to simultaneously measure polarization and fully characterize a polarimeter over a broad range of wavelengths

• Abstract

• Applied Optics, Vol. 50, Issue 28, pp. 5382-5389 (October 2011)
• Matthew J. Romerein, Jeffrey N. Philippson, Robert L. Brooks, Ralph C. Shiell

Comment on “Precision refractive index measurements of air, N₂, O₂, Ar, and CO₂ with a frequency comb”

• Abstract

• Applied Optics, Vol. 50, Issue 35, pp. 6484-6485 (December 2011)
• Petr Křen

Reply to “Comment on the precision refractive index measurements of air, N₂, O₂, Ar, and CO₂with a frequency comb”

• Abstract

• Applied Optics, Vol. 50, Issue 35, pp. 6486-6486 (December 2011)
• J. Zhang, Z. H. Lu

Temperature-dependent visible to near-infrared optical properties of 8 mol% Mg-doped lithium tantalate

• Abstract
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• Optical Materials Express, Vol. 1, Issue 3, pp. 458-465 (July 2011)
• Konstantinos Moutzouris, George Hloupis, Ilias Stavrakas, Dimos Triantis, Ming-Hsien Chou